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Technical Committee on Electromagnetic Compatibility (EMCJ)  (Searched in: 2009)

Search Results: Keywords 'from:2009-04-24 to:2009-04-24'

[Go to Official EMCJ Homepage] 
Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 8 of 8  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2009-04-24
13:05
Okayama   Effect of Frequency Step on Uncertainty of Measurement by Site VSWR Method
Tetsushi Watanabe (Ind Tech. Center of Okayama Prefecture), Yoshitaka Toyota, Kengo Iokibe, Ryuji Koga (Okayama Univ.) EMCJ2009-1
EMI measurement over 1GHz must be operated in a free-space, open area test site. The validation method of free-space con... [more] EMCJ2009-1
pp.1-6
EMCJ 2009-04-24
13:30
Okayama   Effect of Reducing Electromagnetic Noise between Power/Ground Planes with an EBG Pattern on Applying Noise Suppression Sheets
Seiji Yano, Yoshitaka Toyota, Kengo Iokibe, Ryuji Koga (Okayama Univ.), Koichi Kondo, Shigeyoshi Yoshida (NEC TOKIN) EMCJ2009-2
Applying the electromagnetic bandgap (EBG) structure to power/ground planes of printed circuit boards (PCBs) helps preve... [more] EMCJ2009-2
pp.7-12
EMCJ 2009-04-24
13:55
Okayama   Characteristic Analysis of the Microstrip Antenna Attached with Electromagnetic Wave Absorber as a Noise Reduction Model
Kaname Ishigaki, Hiroki Anzai (Tsuruoka National Cll of Tech.) EMCJ2009-3
Electromagnetic wave noises which are radiated from around electronic devices like video tips or circuits on Digital Hig... [more] EMCJ2009-3
pp.13-18
EMCJ 2009-04-24
14:30
Okayama   Examination of the optimum conditions of common-mode noise immunity test by the WBFC method with inclination of impressed noise current
Naoki Kagawa (Fukuyama Univ.) EMCJ2009-4
WBFC method is one of the simple immunity tests to the integrated electric circuits. So, factors of positioning of the ... [more] EMCJ2009-4
pp.19-24
EMCJ 2009-04-24
14:55
Okayama   Estimation of Discharge Currents Injected onto Ground for Contact Discharge from ESD-Gun
Fumihiko Toya, Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.), Shinobu Ishigami, Yukio Yamanaka (NICT) EMCJ2009-5
International Electrotechnical Commission (IEC) prescribes an immunity test (IEC61000-4-2) of electronic equipment for e... [more] EMCJ2009-5
pp.25-29
EMCJ 2009-04-24
15:20
Okayama   Uncertainty of Discharge Current Waveform for Contact Discharge of ESD-Gun onto Ground
Takashi Adachi (Nagoya Inst. of Tech.), Norio Yamamoto (Industrial Research Center of Shiga Prefecture), Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2009-6
International Electro-technical Commission (IEC) prescribes the immunity test (IEC61000-4-2) of electronic equipment aga... [more] EMCJ2009-6
pp.31-34
EMCJ 2009-04-24
16:00
Okayama   [Special Talk] Review over EMC subjects of electronic devices and the evolution of EMI model thereof
Ryuji Koga (Okayama Univ.) EMCJ2009-7
The author devoted efforts to construct concise models amenable for quick calculation instead of the original “true mode... [more] EMCJ2009-7
pp.35-38
EMCJ 2009-04-24
16:40
Okayama   [Special Talk] *
Atsushi Iwata (Hiroshima Univ./A-R-Tec Corp.,) EMCJ2009-8
Based on accurate noise measurement techniques and simulation models for supply/substrate noise, effects of crosstalk no... [more] EMCJ2009-8
pp.39-44
 Results 1 - 8 of 8  /   
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