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Technical Committee on Electromagnetic Compatibility (EMCJ) (Searched in: 2009)
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Search Results: Keywords 'from:2009-04-24 to:2009-04-24'
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[Go to Official EMCJ Homepage] |
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Ascending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ |
2009-04-24 13:05 |
Okayama |
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Effect of Frequency Step on Uncertainty of Measurement by Site VSWR Method Tetsushi Watanabe (Ind Tech. Center of Okayama Prefecture), Yoshitaka Toyota, Kengo Iokibe, Ryuji Koga (Okayama Univ.) EMCJ2009-1 |
EMI measurement over 1GHz must be operated in a free-space, open area test site. The validation method of free-space con... [more] |
EMCJ2009-1 pp.1-6 |
EMCJ |
2009-04-24 13:30 |
Okayama |
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Effect of Reducing Electromagnetic Noise between Power/Ground Planes with an EBG Pattern on Applying Noise Suppression Sheets Seiji Yano, Yoshitaka Toyota, Kengo Iokibe, Ryuji Koga (Okayama Univ.), Koichi Kondo, Shigeyoshi Yoshida (NEC TOKIN) EMCJ2009-2 |
Applying the electromagnetic bandgap (EBG) structure to power/ground planes of printed circuit boards (PCBs) helps preve... [more] |
EMCJ2009-2 pp.7-12 |
EMCJ |
2009-04-24 13:55 |
Okayama |
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Characteristic Analysis of the Microstrip Antenna Attached with Electromagnetic Wave Absorber as a Noise Reduction Model Kaname Ishigaki, Hiroki Anzai (Tsuruoka National Cll of Tech.) EMCJ2009-3 |
Electromagnetic wave noises which are radiated from around electronic devices like video tips or circuits on Digital Hig... [more] |
EMCJ2009-3 pp.13-18 |
EMCJ |
2009-04-24 14:30 |
Okayama |
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Examination of the optimum conditions of common-mode noise immunity test by the WBFC method with inclination of impressed noise current Naoki Kagawa (Fukuyama Univ.) EMCJ2009-4 |
WBFC method is one of the simple immunity tests to the integrated electric circuits. So, factors of positioning of the ... [more] |
EMCJ2009-4 pp.19-24 |
EMCJ |
2009-04-24 14:55 |
Okayama |
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Estimation of Discharge Currents Injected onto Ground for Contact Discharge from ESD-Gun Fumihiko Toya, Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.), Shinobu Ishigami, Yukio Yamanaka (NICT) EMCJ2009-5 |
International Electrotechnical Commission (IEC) prescribes an immunity test (IEC61000-4-2) of electronic equipment for e... [more] |
EMCJ2009-5 pp.25-29 |
EMCJ |
2009-04-24 15:20 |
Okayama |
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Uncertainty of Discharge Current Waveform for Contact Discharge of ESD-Gun onto Ground Takashi Adachi (Nagoya Inst. of Tech.), Norio Yamamoto (Industrial Research Center of Shiga Prefecture), Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2009-6 |
International Electro-technical Commission (IEC) prescribes the immunity test (IEC61000-4-2) of electronic equipment aga... [more] |
EMCJ2009-6 pp.31-34 |
EMCJ |
2009-04-24 16:00 |
Okayama |
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[Special Talk]
Review over EMC subjects of electronic devices and the evolution of EMI model thereof Ryuji Koga (Okayama Univ.) EMCJ2009-7 |
The author devoted efforts to construct concise models amenable for quick calculation instead of the original “true mode... [more] |
EMCJ2009-7 pp.35-38 |
EMCJ |
2009-04-24 16:40 |
Okayama |
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[Special Talk]
* Atsushi Iwata (Hiroshima Univ./A-R-Tec Corp.,) EMCJ2009-8 |
Based on accurate noise measurement techniques and simulation models for supply/substrate noise, effects of crosstalk no... [more] |
EMCJ2009-8 pp.39-44 |
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