| IEICE Technical Committee Submission System Advance Program |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top | Go Back | Prev EMD Conf / Next EMD Conf | [HTML] / [HTML(simple)] / [TEXT] | [Japanese] / [English] |
|
=============================================== Technical Committee on Electromechanical Devices (EMD) Chair: Kiyoshi Yoshida (Nippon Inst. of Tech.) Vice Chair: Makoto Hasegawa (Chitose Inst. of Science and Tech.) Secretary: Junya Sekikawa (Shizuoka Univ.), Nobuhiro Kuga (Yokohama National Univ.) Assistant: Yasuhiro Hattori (Sumitomo Denso) =============================================== Technical Committee on Reliability (R) Chair: Naoto Kaio (Hiroshima Shudo Univ.) Vice Chair: Hitoshi Watanabe (Tokyo Univ. of Science) Secretary: Mitsuhiro Kimura (Hosei Univ.), Hiroyasu Mawatari (NTT) Assistant: Akira Asato (Fujitsu), Nobuyuki Tamura (National Defense Academy) DATE: Fri, Feb 18, 2011 13:00 - 17:10 PLACE: Hamamatsu Campus, Shizuoka University(http://www.eng.shizuoka.ac.jp/outlines/p07/. +81-53-478-1618) TOPICS: ---------------------------------------- Fri, Feb 18 PM (13:00 - 17:10) ---------------------------------------- ----- Opening Address ( 5 min. ) ----- (1) 13:05 - 13:30 Peculiar Phenomena for Increase in Friction Coefficient due to Application of Lubrication Terutaka Tamai, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AN Lab.) (2) 13:30 - 13:55 Direct Viewing of Current in Contact Area used by Light Emission Diode Shigeki Tsukiji, Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ.) (3) 13:55 - 14:20 An experimental study on contact resistance characteristics of relay contacts in evaporated vapor atmospheres Makoto Hasegawa, Nanae Kobayashi (Chitose. Inst. of Sci. & Tech.), Yoshiyuki Kohno (Kaneka) (4) 14:20 - 14:45 Measurement of Contact Resistance Distribution on Electrical Contact Surfaces Eroded by Break Arcs Yohei Yamanashi, Katsuyoshi Miyaji, Junya Sekikawa (Shizuoka Univ.), Takayoshi Kubono (Prof. Emeritus of Shizuoka Univ.) ----- Break ( 15 min. ) ----- (5) 15:00 - 15:25 Detection of degradation sign of LSI operation using IDDQ Shunsuke Sakamoto, Masaru Sanada (KUT) (6) 15:25 - 15:50 Logic stabilization of unstable logic circuit with open fault Taiki Yasutomi, Masaru Sanada (KUT) (7) 15:50 - 16:15 Statistical Quality Control based on Early Life Failure Rate for Electronic Components Toshinari Matsuoka (MELCO) (8) 16:15 - 16:40 Thermal imaging method with Phase Microscopy Tomonori Nakamura, Hidenao Iwai, Toyohiko Yamauchi (HPK CRL), Hirotoshi Terada (HPK) (9) 16:40 - 17:05 A Study on Plating Element and Solderbility for Ni/Sn Lath-like Intermetallic Sadanori Itou (itoken), Masafumi Suzuki (omron) ----- Closing Add ( 5 min. ) ----- # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan. === Technical Committee on Electromechanical Devices (EMD) === # FUTURE SCHEDULE: Fri, Mar 4, 2011: Nippon Institute of Technology [Mon, Jan 17] Apr, 2011: Recess Fri, May 20, 2011: Tohoku Univ. Cyber-Science Center [Thu, Mar 17] # SECRETARY: Makoto Hasegawa（Chitose Inst. of Science and Technorogy） TEL (0123)27-6059、FAX (0123)27-6059 E-mail:      p  n   Junya Sekikawa (Shizuoka Univ.) TEL (053) 478-1618、FAX (053) 478-1618 E-mail: tj  kipc   Yasuhiro Hattori（Sumitomo Wiring Systems, Ltd.) TEL (059)382-8970、FAX (059)382-8591 E-mail:     -t  sws # ANNOUNCEMENT: # Latest information will be presented on the homepage: http://www.ieice.org/es/emd/jpn/ === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, Apr 22, 2011: Kikai-Shinko-Kaikan Bldg. [Fri, Feb 18] Fri, May 13, 2011: Kochi City Culture-Plaza Cul-Port [Mon, Mar 21] # SECRETARY: Kimura, Mitsuhiro (Hosei Univ.) TEL 042-387-6116 FAX 042-387-6126 E-mail: miLast modified: 2011-01-26 18:55:44 |
Notification: Mail addresses are partially hidden against SPAM.
[Download Paper's Information (in Japanese)] <-- Press download button after click here.
[Cover and Index of IEICE Technical Report by Issue]
[Presentation and Participation FAQ] (in Japanese)
[Return to R Schedule Page] / [Return to EMD Schedule Page] /
| Go Top | Go Back | Prev EMD Conf / Next EMD Conf | [HTML] / [HTML(simple)] / [TEXT] | [Japanese] / [English] |
[Return to Top Page]