Fri, Feb 18 PM
13:00 - 17:10 |
| |
13:00-13:05 |
Opening Address ( 5 min. ) |
| (1) |
13:05-13:30 |
Peculiar Phenomena for Increase in Friction Coefficient due to Application of Lubrication |
Terutaka Tamai, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AN Lab.) |
| (2) |
13:30-13:55 |
Direct Viewing of Current in Contact Area used by Light Emission Diode |
Shigeki Tsukiji, Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ.) |
| (3) |
13:55-14:20 |
An experimental study on contact resistance characteristics of relay contacts in evaporated vapor atmospheres |
Makoto Hasegawa, Nanae Kobayashi (Chitose. Inst. of Sci. & Tech.), Yoshiyuki Kohno (Kaneka) |
| (4) |
14:20-14:45 |
Measurement of Contact Resistance Distribution on Electrical Contact Surfaces Eroded by Break Arcs |
Yohei Yamanashi, Katsuyoshi Miyaji, Junya Sekikawa (Shizuoka Univ.), Takayoshi Kubono (Prof. Emeritus of Shizuoka Univ.) |
| |
14:45-15:00 |
Break ( 15 min. ) |
| (5) |
15:00-15:25 |
Detection of degradation sign of LSI operation using IDDQ |
Shunsuke Sakamoto, Masaru Sanada (KUT) |
| (6) |
15:25-15:50 |
Logic stabilization of unstable logic circuit with open fault |
Taiki Yasutomi, Masaru Sanada (KUT) |
| (7) |
15:50-16:15 |
Statistical Quality Control based on Early Life Failure Rate for Electronic Components |
Toshinari Matsuoka (MELCO) |
| (8) |
16:15-16:40 |
Thermal imaging method with Phase Microscopy |
Tomonori Nakamura, Hidenao Iwai, Toyohiko Yamauchi (HPK CRL), Hirotoshi Terada (HPK) |
| (9) |
16:40-17:05 |
A Study on Plating Element and Solderbility for Ni/Sn Lath-like Intermetallic |
Sadanori Itou (itoken), Masafumi Suzuki (omron) |
| |
17:05-17:10 |
Closing Add ( 5 min. ) |
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