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Technical Committee on Reliability (R)
Chair: Mitsuhiro Kimura (Hosei Univ.) Vice Chair: Hiroyasu Mawatari (NTT)
Secretary: Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.)
Assistant: Nobuyuki Tamura (Hosei Univ.), Maratt Zanikef (Kyushu Inst. of Tech.)

Thu, Nov 14, 2013 14:00 - 16:30



Thu, Nov 14 PM (14:00 - 16:30)

(1) 14:00 - 14:25
Newest non-destructive X-ray inspection technology of conducting research and development and failure analysis
-- It introduces from the foundation to application. --
Masahito Natsuhara (shimadzu)

(2) 14:25 - 14:50
Effective non-destructive defect localization by using Enhanced Lock-In Thermography
Toshinobu Nagatomo (DCG Systems)

(3) 14:50 - 15:15
Effect of Plate-Shape Ni-Sn IMC on the Growth Mechanism of Tin Whisker under Thermal Shock Stress
Akira Saito, Akira Okamoto, Yoshihiro Iwahori, Makoto Ogawa (Mutrata MFG), Akihiro Motoki (Sabae Mutrata MFG)

(4) 15:15 - 15:40
A Study on Sn-whisker growth by thermal cycle
Sadanori Itou (Itoken office)

(5) 15:40 - 16:05
Bayesian Reliability Analysis for Software Debugging Processes Based on Remaining Errors
Toru Kaise (Univ. of Hyogo)

(6) 16:05 - 16:30
Issues and Perspectives of Dependable LSI Design
Koichiro Takayama, Akira Asato (Fujitsu)

# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.

- This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan.

=== Technical Committee on Reliability (R) ===

Fri, Dec 13, 2013: [Wed, Oct 16]
Fri, Feb 21, 2014: [Thu, Dec 12]

Akira Asato (FUJITSU)

Last modified: 2013-09-25 15:02:06

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