| IEICE Technical Committee Submission System Advance Program |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top | Go Back | Prev R Conf / Next R Conf | [HTML] / [HTML(simple)] / [TEXT] | [Japanese] / [English] |
|
=============================================== Technical Committee on Reliability (R) Chair: Tetsushi Yuge (National Defense Academy) Vice Chair: Akira Asato (Fujitsu) Secretary: Nobuyuki Tamura (Hosei Univ.), Shigeto Hiraguri (RTRI) Assistant: Shinji Inoue (Kansai Univ.), Hiroyuki Okamura (Hiroshima Univ.) =============================================== Technical Committee on Electromechanical Devices (EMD) Chair: Shinichi Wada (TMC System) Vice Chair: Yoshiki Kayano (Univ. of Electro-Comm.) Secretary: Masato Mizukami (Muroran Inst. of Tech.), Ｋｅｎｊｉ Ｓｕｚｕｋｉ (Fuji Electric) Assistant: Yuichi Hayashi (ＮＡＩＳＴ) DATE: Fri, Feb 15, 2019 13:00 - 17:05 PLACE: (http://nenkin.jpn.panasonic.com/kaikan/map/map.html) TOPICS: ---------------------------------------- Fri, Feb 15 PM (13:00 - 17:05) ---------------------------------------- ----- Opening Address ( 5 min. ) ----- (1) 13:05 - 13:30 A Summary of 29th International Conference on Electrical Contacts and 64th IEEE Holm Conference on Electrical Contacts Koichiro Sawa, Kiyoshi Yoshida, Takahiro Ueno (NIT), Kenji Suzuki (Fuji Electric) (2) 13:30 - 13:55 Influence of width of magnets on shape of break arcs magnetically blown-out in a 500VDC/10A resistive circuit Yuta Kaneko, Sekikawa Junya (Shizuoka Univ.) (3) 13:55 - 14:20 Coming-back phenomenon of Arc Erosion Part to Sliding Surface on Commutator and Brush of DC Machines Koivhiro Sawa, Yoshitada Watanabe, Takahiro Ueno (NIT) ----- Break ( 10 min. ) ----- (4) 14:30 - 14:55 Medium wave transmitting antenna impedance measurement method -- For improving system reliability -- Wataru Arita, Kazuma Shimizu, Kazuhiko Nozaki, Shunto Utsumi (NHK), Taishi Shirakubo, Fumiya Yano (NHK ITEC), Kyoko Kanamori, Masahiko Yamazoe (NHK) (5) 14:55 - 15:55 [Invited Talk] SPICE based circuit performance degradation simulation with MOSFET aging models Koji Tanaka, Shinichiro Amemiya, Hitoshi Okamura, Masanori Shimasue (MoDeCH) ----- Break ( 10 min. ) ----- (6) 16:05 - 17:05 [Invited Talk] Information System Construction which Balances Both Business Continuity and Security Incident Containment Hajime Shimada (Nagoya Univ.) ----- Closing Address ( 5 min. ) ----- # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. Invited Talk will have 50 minutes for presentation and 10 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter. === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, May 24, 2019: Aichi Institute of Technology, Motoyama Campus [Mon, Mar 18], Topics: Software Reliability, Overall reliability engineering # SECRETARY: Hiroyuki Okamura (Hiroshima Univ.) E-mail:        -u === Technical Committee on Electromechanical Devices (EMD) === # FUTURE SCHEDULE: Fri, Mar 1, 2019: [Tue, Jan 15] Fri, May 17, 2019: Cyberscience Center, Tohoku University [Mon, Mar 11] # SECRETARY: Yoshiteru Abe(NTT) TEL +81-29-868-6129，FAX +81-29-868-6142 E-mail: abe        Yuichi Hayashi(NAIST) TEL +81-743-72-5390，FAX +81-743-72-5391 E-mail:  -i is ist Masato Mizukami(Muroran Institute of Technology) TEL&FAX +81-143-46-5307 E-mail: m-    mmm n-itYoshiki Kayano(Univ. of Electro-Comm.) TEL&FAX +81-42-443-5233 E-mail: y    c# ANNOUNCEMENT: # Latest information will be presented on the homepage: http://www.ieice.org/es/emd/jpn/ Last modified: 2018-12-23 23:04:26 |
Notification: Mail addresses are partially hidden against SPAM.
[Download Paper's Information (in Japanese)] <-- Press download button after click here.
[Cover and Index of IEICE Technical Report by Issue]
[Presentation and Participation FAQ] (in Japanese)
[Return to R Schedule Page] / [Return to EMD Schedule Page] /
| Go Top | Go Back | Prev R Conf / Next R Conf | [HTML] / [HTML(simple)] / [TEXT] | [Japanese] / [English] |
[Return to Top Page]