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Technical Committee on Electromechanical Devices (EMD) [schedule] [select]
Chair Shinichi Wada (TMC System)
Vice Chair Yoshiki Kayano (Univ. of Electro-Comm.)
Secretary Masato Mizukami (Muroran Inst. of Tech.), Kenji Suzuki (Fuji Electric)
Assistant Yuichi Hayashi (NAIST)

Technical Committee on Reliability (R) [schedule] [select]
Chair Tetsushi Yuge (National Defense Academy)
Vice Chair Akira Asato (Fujitsu)
Secretary Nobuyuki Tamura (Hosei Univ.), Shigeto Hiraguri (RTRI)
Assistant Shinji Inoue (Kansai Univ.), Hiroyuki Okamura (Hiroshima Univ.)

Conference Date Fri, Feb 15, 2019 13:00 - 17:05
Topics  
Conference Place  
Transportation Guide http://nenkin.jpn.panasonic.com/kaikan/map/map.html
Sponsors This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Registration Fee This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on EMD.

Fri, Feb 15 PM 
13:00 - 17:05
  13:00-13:05 Opening Address ( 5 min. )
(1) 13:05-13:30 A Summary of 29th International Conference on Electrical Contacts and 64th IEEE Holm Conference on Electrical Contacts R2018-52 EMD2018-53 Koichiro Sawa, Kiyoshi Yoshida, Takahiro Ueno (NIT), Kenji Suzuki (Fuji Electric)
(2) 13:30-13:55 Influence of width of magnets on shape of break arcs magnetically blown-out in a 500VDC/10A resistive circuit R2018-53 EMD2018-54 Yuta Kaneko, Sekikawa Junya (Shizuoka Univ.)
(3) 13:55-14:20 Coming-back phenomenon of Arc Erosion Part to Sliding Surface on Commutator and Brush of DC Machines R2018-54 EMD2018-55 Koivhiro Sawa, Yoshitada Watanabe, Takahiro Ueno (NIT)
  14:20-14:30 Break ( 10 min. )
(4) 14:30-14:55 Medium wave transmitting antenna impedance measurement method
-- For improving system reliability --
R2018-55 EMD2018-56
Wataru Arita, Kazuma Shimizu, Kazuhiko Nozaki, Shunto Utsumi (NHK), Taishi Shirakubo, Fumiya Yano (NHK ITEC), Kyoko Kanamori, Masahiko Yamazoe (NHK)
(5) 14:55-15:55 [Invited Talk]
SPICE based circuit performance degradation simulation with MOSFET aging models R2018-56 EMD2018-57
Koji Tanaka, Shinichiro Amemiya, Hitoshi Okamura, Masanori Shimasue (MoDeCH)
  15:55-16:05 Break ( 10 min. )
(6) 16:05-17:05 [Invited Talk]
Information System Construction which Balances Both Business Continuity and Security Incident Containment R2018-57 EMD2018-58
Hajime Shimada (Nagoya Univ.)
  17:05-17:10 Closing Address ( 5 min. )

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.
Invited TalkEach speech will have 50 minutes for presentation and 10 minutes for discussion.

Contact Address and Latest Schedule Information
EMD Technical Committee on Electromechanical Devices (EMD)   [Latest Schedule]
Contact Address Yoshiteru Abe(NTT)
TEL +81-29-868-6129,FAX +81-29-868-6142
E-: abe
Yuichi Hayashi(NAIST)
TEL +81-743-72-5390,FAX +81-743-72-5391
E-: -iisist
Masato Mizukami(Muroran Institute of Technology)
TEL&FAX +81-143-46-5307
E-: m-mmmn-it
Yoshiki Kayano(Univ. of Electro-Comm.)
TEL&FAX +81-42-443-5233
E-: yc 
Announcement Latest information will be presented on the homepage:
http://www.ieice.org/es/emd/jpn/
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Hiroyuki Okamura (Hiroshima Univ.)
E-: -u 


Last modified: 2018-12-23 23:04:26


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