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|
| Chair |
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Hideaki Sone (Tohoku Univ.) |
| Vice Chair |
|
Makoto Hasegawa (Chitose Inst. of Science and Tech.), Ryo Nagase (NTT) |
| Secretary |
|
Kiyoshi Yoshida (Nippon Inst. of Tech.), Toru Kawai (JAE) |
| Assistant |
|
Junya Sekikawa (Shizuoka Univ.) |
|
|
|
| Chair |
|
Shigeru Yanagi (National Defense Academy) |
| Vice Chair |
|
Kazuaki Wakai (NHK) |
| Secretary |
|
Tetsushi Yuge (National Defense Academy), Mitsuhiro Kimura (Hosei Univ.) |
| Assistant |
|
Naoto Kaio (Hiroshima Shudo Univ.), Hisoyasu Mawatari (NTT) |
|
| Conference Date |
Fri, Feb 15, 2008 10:30 - 17:15 |
| Topics |
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| Conference Place |
|
Contact
Person |
077-565-5459 |
| Sponsors |
This conference is co-sponsored by EEE Reliability Society Japan Chapter and Reliability Engineering Association of Japan.
|
Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Fri, Feb 15 AM
10:30 - 16:20 |
| |
10:30-10:40 |
Opening Address ( 10 min. ) |
| (1) |
10:40-11:05 |
Development of Simple ESD Checker and it's Application
-- Detection of ESD Checker and it's Application --  R2007-59 EMD2007-114 |
Norio Yamasaki, Masaru Sanada (KUT) |
| (2) |
11:05-11:30 |
Reliability design and applications for the Non power supply type optical transmission unit R2007-60 EMD2007-115 |
Yoshikazu Toba (Seikoh Giken), Kazuaki Wakai (ITEC) |
| |
11:30-13:00 |
Lunch ( 90 min. ) |
| (3) |
13:00-13:25 |
Decomposition process of silicone and electrical contact failure
-- Influence of silicone contamination on contact devices -- R2007-61 EMD2007-116 |
Terutaka Tamai (Mie Univ.), Yasuhiro Hattori, Hirosaka Ikeda (ANT) |
| (4) |
13:25-13:50 |
Degradation phenomenon of electrical contacts by 3-D oscillating mechanism
-- 3-D oscillating mechanism for trial -- R2007-62 EMD2007-117 |
Shin-ichi Wada, Hiroshi Amao, Hiroto Minegishi, Keiji Koshida, Taketo Sonoda, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa (Keio Univ.) |
| (5) |
13:50-14:15 |
Contact Resistance Characteristics of Tin Plated Contacts with Switching Operation and Surface Observation R2007-63 EMD2007-118 |
Shinya Nakamura, Yuji Yamashita, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetwork) |
| (6) |
14:15-14:40 |
Study of Behavior of Contact Resistance of Fretting Corrosion R2007-64 EMD2007-119 |
Naoyuki Sato, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (AutoNetworks) |
| |
14:40-14:55 |
Break ( 15 min. ) |
| (7) |
14:55-15:20 |
Accuracy Improvement of Dual Wavelength Push-pull Reflectometry (DWPR) Using a Total Reflector R2007-65 EMD2007-120 |
Yasutoshi Komatsu, Keiichi Inoue, Seiichi Onoda (Watanabe Co.,Ltd.,), Nobuo Tsukamoto (DSP Technology Associaetes, Inc.) |
| (8) |
15:20-15:45 |
The investigation of the material for hermetic sealing
-- About gas permeation of materials -- R2007-66 EMD2007-121 |
Tetsuo Hayase, Ichizo Sakamoto (OC.) |
| (9) |
15:45-16:10 |
Reliability of Optical Connector Assembled with Instant Adhesive R2007-67 EMD2007-122 |
Shuichi Yanagi, Shinsuke Matsui, Shigeru Hosono, Ryo Nagase (NTT) |
| |
16:10-16:20 |
Break ( 10 min. ) |
Fri, Feb 15
16:20 - 17:15 |
| (10) |
16:20-17:10 |
[Special Talk]
Holography and Its Application to Reliability Evaluation of the Electromechnical Devices R2007-68 EMD2007-123 |
Masanari Taniguchi (Tohoku Bunka Gakuen University) |
| |
17:10-17:15 |
Closing Address ( 5 min. ) |
| Contact Address and Latest Schedule Information |
| EMD |
Technical Committee on Electromechanical Devices (EMD) [Latest Schedule]
|
| Contact Address |
Toru Kawai（JAE）
TEL (042) 549-9262、FAX (042) 549-9583
E- :   it jae
Kiyoshi Yoshida（NIT）
TEL (0480) 33-7668、FAX (0480) 33-7680
E-:     t
Junya Sekikawa (Shizuoka Univ.)
TEL (053) 478-1618、FAX (053) 478-1618
E-: tj  kipc   |
| Announcement |
Latest information will be presented on the homepage: http://www.ieice.org/es/emd/jpn/ |
| R |
Technical Committee on Reliability (R) [Latest Schedule]
|
| Contact Address |
Tetsushi Yuge (National Defense Academy)
TEL +81-46-841-3810
FAX +81-46-844-5903
E-:  gen |
Last modified: 2007-12-13 18:53:35
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