Fri, Jun 5 AM Young Scientists Award for Excellent Presentations (Room #605 of Conference Tower) 09:30 - 16:55 |
|
09:30-09:40 |
Opening Address ( 10 min. ) |
(1) |
09:40-10:05 |
Evaluation of transmission characteristic on relative humidity for flexible printed circuit board in microwave band |
Akihisa Tsuchiya, Hideaki Sugama, Masami Sakurai, Naomi Hidaka (Kanagawa Ind. Tech Center), Osamu Hashimoto (Aoyama Gakuin Univ.) |
(2) |
10:05-10:30 |
Electromagnetic Bandgap (EBG) Structures Using Open Stubs for Miniaturization of Unit Cell Size |
Hiroshi Toyao, Noriaki Ando (NEC Corp.) |
(3) |
10:30-10:55 |
OFDM signal transmission characteristic of the high-speed power line communication system |
Toru Yamagata, Satoshi Hosoya, Masamitsu Tokuda (Tokyo City Univ), Takashi Matsuo (Sumitomo Electric Ind, Ltd.) |
|
10:55-11:10 |
Break ( 15 min. ) |
(4) |
11:10-11:35 |
Study on EMC problem of medical electronic equipment caused by wideband electromagnetic wave-source |
Kengo Kitaichi (Tokyo City Univ.), Shinobu Ishigami, Kenichi Takizawa, Yasushi Matsumoto, Kiyoshi Hamaguchi (NICT), Masamitsu Tokuda (Tokyo City Univ.) |
(5) |
11:35-12:00 |
Radiated Electric Field from a Solar Cell Module Set on the Ground Plane |
Ryosuke Hasegawa, Mariko Tomisawa, Masamitsu Tokuda (Tokyo City Univ.) |
(6) |
12:00-12:25 |
Immunity Test of IP Device against Burst Impulsive Noises |
Naomichi Nakamura, Yoshiharu Akiyama, Yasunao Suzuki, Ryuichi Kobayashi (NTT) |
|
12:25-13:35 |
Lunch Break ( 70 min. ) |
(7) |
13:35-14:00 |
A Study on Shield Structure of a Connector Substrate with Single Point Ground Plane Connection |
Satoshi Yoneda (Mitsubishi Electric Corp.), Takefumi Kumamoto (Mitsubishi Electric Engineering Co.Ltd.), Chiharu Miyazaki, Naoto Oka (Mitsubishi Electric Corp.) |
(8) |
14:00-14:25 |
Influence of decoupling device on current distribution
-- Examination by simulation and measurement -- |
Kazuya Kumehara (Tokyo Univ. of Sci.), Koichiro Masuda (Tokyo Univ. of Sci./NEC), Kohji Koshiji (Tokyo Univ. of Sci.) |
(9) |
14:25-14:50 |
De-embedding of Board Parasitics with T-Parameters for S-Parameter Measurements of Integrated Circuits on PCB
-- Examinations in One-port Measurements -- |
Kazuki Maeda, Kengo Iokibe, Yoshitaka Toyota, Ryuji Koga (Okayama Univ.) |
(10) |
14:50-15:15 |
Study for extracting the characteristics of LSI power supply at high frequency including the parasitic coupling between package and chip |
Tomohiro Kita, Yuichi Mabuchi, Hiroshi Tanaka, Takashi Hisakado, Osami Wada (Kyoto Univ.), Atsushi Nakamura (Renesas Tech.) |
|
15:15-15:30 |
Break ( 15 min. ) |
(11) |
15:30-15:55 |
Uncertainty of GHz-Band Whole-Body Average SARs in Infants Based on Kaup Indicies |
Hironobu Miwa, Akimasa Hirata, Osamu Fujiwara (Nagoya Inst. of Tech.), Tomoaki Nagaoka, Soichi Watanabe (NICT) |
(12) |
15:55-16:20 |
In-vivo Measurement of Dielectric Properties for Humane Body Tissue |
Yusuke Sato, Akimasa Hirata, Osamu Fujiwara (Nagoya Inst. of Tech.) |
(13) |
16:20-16:45 |
Analysis of Temperature Rise in Rats for 1.5-GHz Microwave Exposure |
Yuya Kanai, Akimasa Hirata, Osamu Fujiwara (Nagoya Inst. Tech.), Hiroshi Masuda (Univ. Bordeaux), Hiroki Kawai (NICT), Takuji Arima (NICT/Tokyo Univ. of Agri. and Tech.), Soichi Watanabe (NICT) |
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16:45-16:55 |
Closing Address ( 10 min. ) |