Fri, Apr 24 PM 13:00 - 17:20 |
|
13:00-13:05 |
Opening Address ( 5 min. ) |
(1) |
13:05-13:30 |
Effect of Frequency Step on Uncertainty of Measurement by Site VSWR Method |
Tetsushi Watanabe (Ind Tech. Center of Okayama Prefecture), Yoshitaka Toyota, Kengo Iokibe, Ryuji Koga (Okayama Univ.) |
(2) |
13:30-13:55 |
Effect of Reducing Electromagnetic Noise between Power/Ground Planes with an EBG Pattern on Applying Noise Suppression Sheets |
Seiji Yano, Yoshitaka Toyota, Kengo Iokibe, Ryuji Koga (Okayama Univ.), Koichi Kondo, Shigeyoshi Yoshida (NEC TOKIN) |
(3) |
13:55-14:20 |
Characteristic Analysis of the Microstrip Antenna Attached with Electromagnetic Wave Absorber as a Noise Reduction Model |
Kaname Ishigaki, Hiroki Anzai (Tsuruoka National Cll of Tech.) |
|
14:20-14:30 |
Break ( 10 min. ) |
(4) |
14:30-14:55 |
Examination of the optimum conditions of common-mode noise immunity test by the WBFC method with inclination of impressed noise current |
Naoki Kagawa (Fukuyama Univ.) |
(5) |
14:55-15:20 |
Estimation of Discharge Currents Injected onto Ground for Contact Discharge from ESD-Gun |
Fumihiko Toya, Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.), Shinobu Ishigami, Yukio Yamanaka (NICT) |
(6) |
15:20-15:45 |
Uncertainty of Discharge Current Waveform for Contact Discharge of ESD-Gun onto Ground |
Takashi Adachi (Nagoya Inst. of Tech.), Norio Yamamoto (Industrial Research Center of Shiga Prefecture), Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.) |
|
15:45-15:55 |
Break ( 10 min. ) |
|
- |
|
(7) |
16:00-16:40 |
[Special Talk]
Review over EMC subjects of electronic devices and the evolution of EMI model thereof |
Ryuji Koga (Okayama Univ.) |
(8) |
16:40-17:20 |
[Special Talk]
* |
Atsushi Iwata (Hiroshima Univ./A-R-Tec Corp.,) |