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Technical Committee on Reliability (R) [schedule] [select]
Chair Shigeru Yanagi (National Defense Academy)
Vice Chair Kazuaki Wakai (NHK)
Secretary Tetsushi Yuge (National Defense Academy), Mitsuhiro Kimura (Hosei Univ.)
Assistant Naoto Kaio (Hiroshima Shudo Univ.), Hisoyasu Mawatari (NTT)

Technical Committee on Electromechanical Devices (EMD) [schedule] [select]
Chair Ryo Nagase (NTT)
Vice Chair Kiyoshi Yoshida (Nippon Inst. of Tech.)
Secretary Makoto Hasegawa (Chitose Inst. of Science and Tech.), Junya Sekikawa (Shizuoka Univ.)
Assistant Mitsuo Ichiya (Matsushita)

Conference Date Fri, Feb 20, 2009 09:50 - 17:35
Topics  
Conference Place Head Office, Sumitomo Wiring Systems LTD. 
Address 1-14 Nishisuehiro-cho, Yokkaichi, Mie 510-8503, Japan
Transportation Guide JR Kansai Line: 10 minutes on foot from Yokkaichi Station
http://www.sws.co.jp/en/corporation/office_honsha.html
Contact
Person
Yasuhiro Hattori
+81-59-382-8714
Sponsors This conference is co-sponsored by EEE Reliability Society Japan Chapter and Reliability Engineering Association of Japan.
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

Fri, Feb 20 AM 
09:50 - 17:35
(1) 09:50-10:15 Contact resistance analysis of electric contact with tin or silver plated layer R2008-44 EMD2008-120 Shigeru Sawada (Mie Univ.), Kaori Shimizu, Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Terutaka Tamai (Mie Univ.)
(2) 10:15-10:40 Growth Law of the Oxide Film Formed on the tin Plated Contact Surface and Its Contact Resistance Characteristic
-- Study applied by ellipsometry --
R2008-45 EMD2008-121
Yuya Nabeta, Yasushi Saitoh, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Terutaka Tamai (Mie Univ.)
(3) 10:40-11:05 Influence of Aging on Contact Resistance Characteristics of Tin Plated Contacts R2008-46 EMD2008-122 Yuichi Tominaga, Takuya Yamanaka, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.)
(4) 11:05-11:30 Influence of Fretting Corrosion on Lifetime of Tin Plated Connectors R2008-47 EMD2008-123 Daiji Ito, Hirosaka Ikeda, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (Auto Networks Tech, Ltd)
  11:30-12:30 Lunch Break ( 60 min. )
(5) 12:30-12:55 Microscopy Study of Fretting Corrosion of the Tin Plated Contacts R2008-48 EMD2008-124 Tetsuya Ito, Shigeru Sawada, Yoshiyuki Nomura (ANTAutoNetworks Tech, Ltd.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.)
(6) 12:55-13:20 An experimental study on evaluation system for contact surraces with an optical-cross method R2008-49 EMD2008-125 Makoto Kashiwakura, Shunsuke Kudo, Asuka Sudo, Makoto Hasegawa (Chitose Inst. of Sci. & Tech.)
(7) 13:20-13:45 Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- for Contact Resistance (IV) --
R2008-50 EMD2008-126
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System), Koichiro Sawa (Keio Univ.)
(8) 13:45-14:10 Pull strength analysis of Pb free solder at a connected point R2008-51 EMD2008-127 Taku Hashiguchi, Yuta Nasukawa, Kazunori Hiraoka (Salesian Polytecn.)
  14:10-14:25 Break ( 15 min. )
(9) 14:25-14:50 Evaluation of electric contact trouble caused by silicone.
-- Evaluation test with new environmental examination device --
R2008-52 EMD2008-128
Makito Morii, Hiroyuki Moriwaki (OMRON), Hideki Tanaka, Yoshitaka Ueki, Kenji Suzuki, Kimio Yoshizumi, Masanobu Nishikawa (espec)
(10) 14:50-15:15 Dependency of Occurrence of Contact Failure due to Silicone Contamination on Electrical Load Conditions R2008-53 EMD2008-129 Terutaka Tamai (Mie Univ.)
(11) 15:15-15:40 An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts R2008-54 EMD2008-130 Makoto Hasegawa, Takuma Matsuto (Chitose Inst. of Sci. & Tech.), Yoshiyuki Kohno, Hiroshi Ando (Kaneka Corp.)
  15:40-15:55 Break ( 15 min. )
(12) 15:55-16:20 * R2008-55 EMD2008-131 Sadanori Ito (Itoken office)
(13) 16:20-16:45 Avoidance for lightning damages on the stray metal portion of the broadcasting system R2008-56 EMD2008-132 Kazuaki Wakai (Daiichi Univ.), Yuji Sawaguri (SGC)
(14) 16:45-17:10 Reliability test results for SC and MU connectors installed on outside plant R2008-57 EMD2008-133 Yoshiteru Abe, Shuichi Yanagi, Shuichiro Asakawa, Ryo Nagase (NTT)
(15) 17:10-17:35 Development of undressing detection system of uniforms by human body communication. (without presentation) Akinori Kondo (TMCIT), Sayumi Kamata (TMCAE), Masaki Fujikawa (Chuo Univ.), Kenji Furusawa (Mitsuya Lab.), Masakatsu Nishigaki (Shizuoka Univ.), Masasumi Yoshizawa (TMCIT)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Tetsushi Yuge (National Defense Academy)
TEL +81-46-841-3810
FAX +81-46-844-5903
E-: gen 
EMD Technical Committee on Electromechanical Devices (EMD)   [Latest Schedule]
Contact Address Makoto Hasegawa(Chitose Inst. of Science and Technorogy)
TEL (0123)27-6059、FAX (0123)27-6059
E-: pn
Junya Sekikawa (Shizuoka Univ.)
TEL (053) 478-1618、FAX (053) 478-1618
E-: tjkipc
Mituo Ichiya(Matsushita Electric Works)
TEL (070)5432-0873、FAX (03)6218-1921
E-: iw 
Announcement Latest information will be presented on the homepage: http://www.ieice.org/es/emd/jpn/


Last modified: 2009-09-07 15:53:51


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