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=============================================== Technical Committee on Reliability (R) Chair: Shigeru Yanagi (National Defense Academy) Vice Chair: Kazuaki Wakai (NHK) Secretary: Tetsushi Yuge (National Defense Academy), Mitsuhiro Kimura (Hosei Univ.) Assistant: Naoto Kaio (Hiroshima Shudo Univ.), Hisoyasu Mawatari (NTT) =============================================== Technical Committee on Electromechanical Devices (EMD) Chair: Ryo Nagase (NTT) Vice Chair: Kiyoshi Yoshida (Nippon Inst. of Tech.) Secretary: Makoto Hasegawa (Chitose Inst. of Science and Tech.), Junya Sekikawa (Shizuoka Univ.) Assistant: Mitsuo Ichiya (Matsushita) DATE: Fri, Feb 20, 2009 09:50 - 17:35 PLACE: Head Office, Sumitomo Wiring Systems LTD.(1-14 Nishisuehiro-cho, Yokkaichi, Mie 510-8503, Japan. JR Kansai Line: 10 minutes on foot from Yokkaichi Station. http://www.sws.co.jp/en/corporation/office_honsha.html. Yasuhiro Hattori. +81-59-382-8714) TOPICS: ---------------------------------------- Fri, Feb 20 AM (09:50 - 17:35) ---------------------------------------- (1) 09:50 - 10:15 Contact resistance analysis of electric contact with tin or silver plated layer Shigeru Sawada (Mie Univ.), Kaori Shimizu, Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Terutaka Tamai (Mie Univ.) (2) 10:15 - 10:40 Growth Law of the Oxide Film Formed on the tin Plated Contact Surface and Its Contact Resistance Characteristic -- Study applied by ellipsometry -- Yuya Nabeta, Yasushi Saitoh, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Terutaka Tamai (Mie Univ.) (3) 10:40 - 11:05 Influence of Aging on Contact Resistance Characteristics of Tin Plated Contacts Yuichi Tominaga, Takuya Yamanaka, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.) (4) 11:05 - 11:30 Influence of Fretting Corrosion on Lifetime of Tin Plated Connectors Daiji Ito, Hirosaka Ikeda, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (Auto Networks Tech, Ltd) ----- Lunch Break ( 60 min. ) ----- (5) 12:30 - 12:55 Microscopy Study of Fretting Corrosion of the Tin Plated Contacts Tetsuya Ito, Shigeru Sawada, Yoshiyuki Nomura (ANTAutoNetworks Tech, Ltd.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.) (6) 12:55 - 13:20 An experimental study on evaluation system for contact surraces with an optical-cross method Makoto Kashiwakura, Shunsuke Kudo, Asuka Sudo, Makoto Hasegawa (Chitose Inst. of Sci. & Tech.) (7) 13:20 - 13:45 Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- for Contact Resistance (IV) -- Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System), Koichiro Sawa (Keio Univ.) (8) 13:45 - 14:10 Pull strength analysis of Pb free solder at a connected point Taku Hashiguchi, Yuta Nasukawa, Kazunori Hiraoka (Salesian Polytecn.) ----- Break ( 15 min. ) ----- (9) 14:25 - 14:50 Evaluation of electric contact trouble caused by silicone. -- Evaluation test with new environmental examination device -- Makito Morii, Hiroyuki Moriwaki (OMRON), Hideki Tanaka, Yoshitaka Ueki, Kenji Suzuki, Kimio Yoshizumi, Masanobu Nishikawa (espec) (10) 14:50 - 15:15 Dependency of Occurrence of Contact Failure due to Silicone Contamination on Electrical Load Conditions Terutaka Tamai (Mie Univ.) (11) 15:15 - 15:40 An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts Makoto Hasegawa, Takuma Matsuto (Chitose Inst. of Sci. & Tech.), Yoshiyuki Kohno, Hiroshi Ando (Kaneka Corp.) ----- Break ( 15 min. ) ----- (12) 15:55 - 16:20 * Sadanori Ito (Itoken office) (13) 16:20 - 16:45 Avoidance for lightning damages on the stray metal portion of the broadcasting system Kazuaki Wakai (Daiichi Univ.), Yuji Sawaguri (SGC) (14) 16:45 - 17:10 Reliability test results for SC and MU connectors installed on outside plant Yoshiteru Abe, Shuichi Yanagi, Shuichiro Asakawa, Ryo Nagase (NTT) (15) 17:10 - 17:35 Development of undressing detection system of uniforms by human body communication. Akinori Kondo (TMCIT), Sayumi Kamata (TMCAE), Masaki Fujikawa (Chuo Univ.), Kenji Furusawa (Mitsuya Lab.), Masakatsu Nishigaki (Shizuoka Univ.), Masasumi Yoshizawa (TMCIT) # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by EEE Reliability Society Japan Chapter and Reliability Engineering Association of Japan. === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, Apr 17, 2009: Kikai-Shinko-Kaikan Bldg. [Wed, Feb 18] Fri, May 29, 2009: Hiroshima Shudo University [Sun, Mar 15] # SECRETARY: Tetsushi Yuge (National Defense Academy) TEL +81-46-841-3810 FAX +81-46-844-5903 E-mail:  ge n  === Technical Committee on Electromechanical Devices (EMD) === # FUTURE SCHEDULE: Fri, Mar 6, 2009: Kougakuin Univ. [Mon, Jan 19], Topics: Short note (Graduation thesis and master's thesis) Apr, 2009: Recess Fri, May 22, 2009: Kanda camupus, Nippon Institute of Technology [Mon, Mar 23], Topics: Electrical discharge and EMC/general # SECRETARY: Makoto Hasegawa（Chitose Inst. of Science and Technorogy） TEL (0123)27-6059、FAX (0123)27-6059 E-mail:     p  n  Junya Sekikawa (Shizuoka Univ.) TEL (053) 478-1618、FAX (053) 478-1618 E-mail: tj  kipc   Mituo Ichiya（Matsushita Electric Works) TEL (070)5432-0873、FAX (03)6218-1921 E-mail: i    w # ANNOUNCEMENT: # Latest information will be presented on the homepage: http://www.ieice.org/es/emd/jpn/ Last modified: 2009-09-07 15:53:51 |
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