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Technical Committee on Reliability (R) [schedule] [select]
Chair Akira Asato (Fujitsu)
Vice Chair Tadashi Dohi (Hiroshima Univ.)
Secretary Nobuyuki Tamura (Hosei Univ.), Shinji Inoue (Kansai Univ.)
Assistant Hiroyuki Okamura (Hiroshima Univ.), Shinji Yokogawa (Univ. of Electro-Comm.)

Technical Committee on Electromechanical Devices (EMD) [schedule] [select]
Chair Shinichi Wada (TMC System)
Vice Chair Yoshiki Kayano (Univ. of Electro-Comm.)
Secretary Kenji Suzuki (Fuji Electric), Masato Mizukami (Muroran Inst. of Tech.)
Assistant Yuichi Hayashi (NAIST)

{INFOMESITEM}
Conference Date Fri, Feb 14, 2020 13:30 - 15:55
Topics  
Conference Place  
Sponsors This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Registration Fee This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on EMD, R.

Fri, Feb 14 PM 
13:30 - 15:55
  13:30-13:35 Opening Address ( 5 min. )
(1) 13:35-14:00 Trend on standardization of Dependability
-- Outline of IEC TC 56 2016 Sydney international meeting and drafts from Japan --
R2019-54 EMD2019-54
Hiroyuki Goto (FDK), Yoshinobu Sato (The IHQI, Tokyo Healthcare Foundation), Fumiaki Harada (D-Tech Partners), Yoshiki Kinoshita (Kanagawa University)
(2) 14:00-14:25 Hardware security as a root of trust in information systems
-- Focusing on EM information security --
R2019-55 EMD2019-55
Yuichi Hayashi (NAIST)
  14:25-14:35 Break ( 10 min. )
(3) 14:35-15:00 Observations of break arc behaviors of AgSnO2 contacts in a DC inductive load under application of an external magnetic field R2019-56 EMD2019-56 Makoto Hasegawa, Seika Tokumitsu (Chitose Inst. of Science & Technology)
(4) 15:00-15:25 Forcible division of break arcs in small space occurring in a 150V-400VDC/10A resistive circuit by a dividing plate made of PTFE R2019-57 EMD2019-57 Yuichiro Kimura, Junya Sekikawa (Shizuoka Univ.)
(5) 15:25-15:50 A Study on Design of Filter by Preference Set-based Design
-- Evaluation of Robustness --
R2019-58 EMD2019-58
Yoshiki Kayano, Yoshio Kami, Fengchao Xiao (UEC)
  15:50-15:55 Closing Address ( 5 min. )

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Shinji Inoue (Kansai Univ.)
E-: ini-u 
EMD Technical Committee on Electromechanical Devices (EMD)   [Latest Schedule]
Contact Address Shin-ichi Wada(TMC)
TEL +81-44-555-6171,FAX +81-44-211-4200
E-: s-tmysm
Yoshiki Kayano(Univ. of Electro-Comm.)
TEL&FAX +81-42-443-5233
E-: yc
Masato Mizukami(Muroran Institute of Technology)
TEL&FAX +81-143-46-5307
E-: m-mmmn-it
Kenji Suzuki (Fuji Electric FA Components & Systems)
TEL +81-48-547-1037,FAX +81-48-549-1825
E-: -knjelectc
Yuichi Hayashi(NAIST)
TEL +81-743-72-5390,FAX +81-743-72-5391
E-: -iisist 
Announcement Latest information will be presented on the homepage:
http://www.ieice.org/es/emd/jpn/


Last modified: 2019-12-23 17:29:42


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