| Conference Date |
Fri, May 22, 2009 09:30 - 16:45 |
| Topics |
Electrical discharge and EMC/general |
| Conference Place |
Kanda Campus, Nippon Institute of Technology |
| Address |
2-5 Jimbocho, Kanda, Chiyoda-ku, Tokyo 101-0051, JAPAN |
| Transportation Guide |
2 min walk from Exit A1 or A6 of Jimbocho station (Tokyo Metro Hanzomon Line, Toei Mita Line, or Toei Shinjuku Line)
http://mot.nit.ac.jp/english/submenu/access.html |
Contact
Person |
Assistant Prof. Kiyoshi Yoshida
+81-3-3511-7591 |
| Sponsors |
This conference is co-sponsored by IEEE EMC Society Japan Chapter. This conference is technical co-sponsored by IEEE EMC Society Sendai Chapter.
|
Fri, May 22 AM
09:30 - 11:55 |
| |
09:30-09:35 |
Opening Address ( 5 min. ) |
| (1) |
09:35-10:00 |
An experimental study on influence of surrounding atmosphere to gaseous phase transition in contacts break arc |
Kiyoshi Yoshida, Naomichi Yamada (Nippon Inst. of Tech.) |
| (2) |
10:00-10:25 |
Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- Contact Resistance (V) -- |
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co.Ltd.), Koichiro Sawa (Keio Univ.) |
| (3) |
10:25-10:50 |
Arc Energy and Electrode Loss of AgNi Contacts for Electromagnetic Contactors |
Koichiro Sawa (Keio Univ.), Kenji Suzuki, Masaaki Watanabe (Fuji Electric FA Components & Systems Co.,Ltd.,) |
| |
10:50-11:05 |
Break ( 15 min. ) |
| (4) |
11:05-11:30 |
Characteristics of break arc in a DC20-500V/5-30A circuit |
Tomohiro Atsumi, Junya Sekikawa, Takayoshi Kubono (Shizuoka Univ.) |
| (5) |
11:30-11:55 |
Melting bridge formation processwhich differs in the material |
Masami Mori (Nippon Inst. of Tech.) |
| |
11:55-13:00 |
Lunch Break ( 65 min. ) |
Fri, May 22 PM
13:00 - 16:45 |
| (6) |
13:00-13:25 |
Non-contact Measurement of Passive Intermodulation in Electrical Contacts |
Nobuhiro Kuga (Yokohama Nat'l Univ.) |
| (7) |
13:25-13:50 |
A study on characteristics extraction of contact voltage waveform at slowly breaking silver contact |
Shingo Hanawa, Yoshiki Kayano, Kazuaki Miyanaga, Hiroshi Inoue (Akita Univ.) |
| (8) |
13:50-14:15 |
Measurement and simulation of electrostatic discharge waveform when ESD is given to PCB ground |
Mikiya Iida (Toshiba) |
| (9) |
14:15-14:40 |
Relation Between Radiated Electromagnetic Field Intensity and Electrode Condition due to Micro Gap Discharge |
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) |
| |
14:40-15:00 |
Break ( 20 min. ) |
| (10) |
15:00-15:25 |
Electric field strength from an electromagnetic field immunity test system applying array antenna technology |
Takeshi Uchida, Chiharu Miyazaki, Naoto Oka, Koichiro Misu, Yoshihiko Konishi (Mitsubishi Electric Corp.) |
| (11) |
15:25-15:50 |
Voltage Distribution Measurement of Power Plane by Decoupling Capacitor on PCBs |
Yuichi Sasaki, Chiharu Miyazaki, Naoto Oka, Koichiro Misu (MITSUBISHI ELECTRIC) |
| (12) |
15:50-16:15 |
Equivalent Circuit Expressions for EMI Problems in PLC |
Yoshio Kami (Univ. of Electro-Comm.), Akira Sugiura (NICT) |
| (13) |
16:15-16:40 |
Antenna Calibration by 3-Antenna Method with the In-Phase Synthetic Method |
Katsumi Fujii, Yukio Yamanaka (NICT), Akira Sugiura (Telecom Engineering Center) |
| |
16:40-16:45 |
Closing Address ( 5 min. ) |
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