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Technical Committee on Reliability (R) [schedule] [select]
Chair Akira Asato (Fujitsu)
Vice Chair Tadashi Dohi (Hiroshima Univ.)
Secretary Nobuyuki Tamura (Hosei Univ.), Shinji Inoue (Kansai Univ.)
Assistant Hiroyuki Okamura (Hiroshima Univ.), Shinji Yokogawa (Univ. of Electro-Comm.)

Conference Date Fri, Jun 14, 2019 14:00 - 16:20
Topics Overall reliability engineering 
Conference Place  
Sponsors This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
Participation Fee This workshop will be held as the IEICE workshop in fully electronic publishing. Participant fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the participant fee page. We request the participant fee to participants who will attend the workshop(s) on R.

Fri, Jun 14 PM 
14:00 - 16:20
(1) 14:00-14:25 Simultaneous and concentrated failure model and reliability Tetsushi Yuge (NDA)
(2) 14:25-14:50 Analysis of a Markovian deteriorating system with decision of optimal degree of repair Nobuyuki Tamura (Hosei Univ.)
(3) 14:50-15:15 Reliability modeling of advanced electron devices based on clustered defects and stress distribution Shinji Yokogawa, Kyosuke Kunii (UEC)
  15:15-15:30 Break ( 15 min. )
(4) 15:30-15:55 Identification comparison of software fault-prone modules using nonlinear logistic regression models Kazunari Yamanaka, Tadashi Dohi, Hiroyuki Okamura (Hiroshima U.)
(5) 15:55-16:20 Evaluation for the Algorithm of Minimum Cost-Flow Problem by Using Iterative Deepening Depth- First Search Tomoaki Akiba (CIT), Natsumi Takahashi (AGU), Hisashi Yamamoto (TMU)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Hiroyuki Okamura (Hiroshima Univ.)
E-: -u 


Last modified: 2019-04-23 09:05:58


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