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Technical Committee on Electromechanical Devices (EMD) [schedule] [select]
Chair Yoshiki Kayano (Univ. of Electro-Comm.)
Secretary Takahiro Ueno (Nippon Inst. of Tech.)
Assistant Yuichi Hayashi (NAIST), Kazuaki Miyanaga (Fujitsu Component)

Technical Committee on Reliability (R) [schedule] [select]
Chair Akira Asato (Fujitsu)
Vice Chair Tadashi Dohi (Hiroshima Univ.)
Secretary Nobuyuki Tamura (Hosei Univ.), Shinji Inoue (Kansai Univ.)
Assistant Hiroyuki Okamura (Hiroshima Univ.), Shinji Yokogawa (Univ. of Electro-Comm.)

Conference Date Fri, Feb 12, 2021 13:30 - 15:45
Conference Place  
Sponsors This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Registration Fee This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on EMD, R.

Fri, Feb 12 PM 
13:30 - 15:45
  13:30-13:35 Opening Address ( 5 min. )
(1) 13:35-14:00 Photograph observation of 12 parallel discharge arcs generated in the atmosphere by a reliable trigger gap switch R2020-34 EMD2020-25 Tomokatsu Aizawa (Tokyo Metropolitan College)
(2) 14:00-14:25 Motion characteristics of break arcs generated in a 450VDC/10A circuit and surface temperature of arc runners R2020-35 EMD2020-26 Hiroyuki Sato, Junya Sekikawa (Shizuoka Univ.)
  14:25-14:35 Break ( 10 min. )
(3) 14:35-15:00 Battery degradation diagnosis of mobile devices by using questionnaire data for individual usages R2020-36 EMD2020-27 Minoru Asano, Shinji Yokogawa, You Ishigaki (UEC), Junichi Tominaga, Hamakazu Awazu (Keitaiichiba)
(4) 15:00-15:45 [Invited Talk]
Reliability physics issues for electronic devices
-- Failure mechanisms that still need to be physically clarified --
R2020-37 EMD2020-28
Yasushi Kadota (RICOH Co.,Ltd.)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
EMD Technical Committee on Electromechanical Devices (EMD)   [Latest Schedule]
Contact Address Yuichi Hayashi(NAIST)
E-: -iisist 
Announcement Latest information will be presented on the homepage:
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Shinji Inoue (Kansai Univ.)
E-: ini-u 

Last modified: 2020-12-22 09:44:53

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