お知らせ 2023年度・2024年度 学生員 会費割引キャンペーン実施中です
お知らせ 技術研究報告と和文論文誌Cの同時投稿施策(掲載料1割引き)について
お知らせ 電子情報通信学会における研究会開催について
お知らせ NEW 参加費の返金について
電子情報通信学会 研究会発表申込システム
研究会 開催プログラム
技報閲覧サービス
[ログイン]
技報アーカイブ
 トップ  戻る   / [HTML] / [HTML(simple)] / [TEXT]  [Japanese] / [English] 

★電子デバイス研究会(ED)
専門委員長 橋詰 保 (北大)  副委員長 加地 徹 (豊田中研)
幹事 原 直紀 (富士通研), 津田 邦男 (東芝)
幹事補佐 須原 理彦 (首都大東京), 上田 哲三 (パナソニック)

★シリコン材料・デバイス研究会(SDM)
専門委員長 遠藤 哲郎 (東北大)
副委員長 奈良 安雄 (富士通マイクロエレクトロニクス)
幹事 小野 行徳 (NTT), 大西 克典 (九工大)
幹事補佐 野村 晋太郎 (筑波大)

日時 2010年 6月30日(水) 09:40~17:30
   2010年 7月 1日(木) 09:30~13:05
   2010年 7月 2日(金) 09:30~16:50

会場 東京工業大学 大岡山キャンパス(〒152-8550 東京都目黒区大岡山2-12-1.東京急行 大井町線・目黒線 大岡山駅下車 徒歩1分.http://www.titech.ac.jp/about/campus/index.html.大学院理工学研究科 宮本 恭幸.03-5734-2572)

議題 第18回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2010)

−−− 委員長挨拶 ( 10分 ) −−−

6月30日(水) 午前 -Plenary Session 1- (09:40~10:30)

(1) 09:40 - 10:20
[基調講演]Challenge for electromechanical logic systems using compound semiconductor heterostructures
○Hiroshi Yamaguchi・Imran Mahboob・Hajime Okamoto・Koji Onomitsu(NTT)

−−− 休憩 ( 10分 ) −−−

6月30日(水) 午前 -Session 1A : Emerging Device Technology 1- (10:30~14:25)

(1) 10:30 - 10:55
[招待講演]Nano-Electromechanical (NEM) Nonvolatile Memory for Low-Power Electronics
○Woo Young Choi(Sogang Univ.)

(2) 10:55 - 11:20
[招待講演]Dual-gate ZnO thin-film transistors with SiNx as Dielectric Layer
Young Su Kim・Min Ho Kang(National Nanofab Center)・Kang Suk Jeong(Chungnam National Univ.)・Jae Sub Oh・Dong Eun Yoo(National Nanofab Center)・Hi Deok Lee・○Ga-Won Lee(Chungnam National Univ.)

(3) 11:20 - 11:45
[招待講演]Piezoelectric material based passive RFID tags
○Hyunchul Bae・Jaekwon Kim・Jinwook Burm(Sogang Univ.)

−−− 休憩 ( 15分 ) −−−

(4) 12:00 - 12:25
[招待講演]Low-temperature Epitaxial Growth of Ferromagnetic Silicide for SiGe Based Spintransistors
○Masanobu Miyao(Kyushu Univ.)・Kohei Hamaya(Kyushu Univ./JST)

(5) 12:25 - 12:50
[招待講演]Toward high-efficiency thin-film solar cells using semiconducting BaSi2
○Takashi Suemasu・Mitsutaka Saito・Atsushi Okada・Katsuaki Tou・Ajimal Khan(Univ. of Tsukuba.)・Noritaka Usami(Tohoku Univ.)

(6) 12:50 - 13:15
[招待講演]Applications of Smart Cut(TM) Technologies to III-V Based Engineered Substrates
○Makoto Yoshimi(Soitec)

−−− 昼食 ( 70分 ) −−−

6月30日(水) 午後 -Session 2A : Memory 1- (14:25~15:40)

(1) 14:25 - 14:40
A New Cone-Type 1T DRAM Cell
○Gil Sung Lee・Doo-Hyun Kim・Jang-Gn Yun・Jung Hoon Lee・Yoon Kim・Jong-Ho Lee・Hyungcheol Shin・Byung-Gook Park(Seoul National Univ.)

(2) 14:40 - 14:55
Dependence of Ag film thickness on Formation of Ag Nano-crystals to Fabricate Polymer Nonvolatile Memory
○Jong-Dae Lee・Hyun-Min Seung・Kyoung-Cheol Kwon・Jea-Gun Park(Hanyang Univ.)

(3) 14:55 - 15:10
The Impact of H2 Anneal on Resistive Switching in Pt/TiO2/Pt Structure
○Guobin Wei・Yuta Goto・Akio Ohta・Katsunori Makihara・Hideki Murakami・Seiichiro Higashi・Seiichi Miyazaki(Hiroshima Univ.)

(4) 15:10 - 15:25
Threshold Voltage Roll-off Mechanisms in SONOS Flash Memory in Retention Mode Including Trapped Charge Redistribution Effect
○Doo-Hyun Kim・Gil Sung Lee・Seongjae Cho・Jung Hoon Lee・Jang-Gn Yun・Dong Hua Li・Yoon Kim・Se Hwan Park・Won Bo Shim・Wandong Kim・Byung-Gook Park(Seoul National Univ.)

−−− 休憩 ( 15分 ) −−−

6月30日(水) 午後 -Session 3A : Emerging Device Technology 2- (15:40~17:25)

(1) 15:40 - 15:55
Vertical Organic Field Effect Transistors with an Additional Gate Insulation Structure between Active Layer and Gate Electrode
○Donghyun Kim・Jaewook Jeong・Yongtaek Hong(Seoul National Univ.)

(2) 15:55 - 16:10
Investigation of n-type pentacene based MOS diodes with ultra-thin metal interface layer
○Young uk Song・Shun-ichiro Ohmi(Tokyo Inst. of Tech.)

(3) 16:10 - 16:25
Fundamental oscillations at ~900 GHz with low bias voltages in RTDs having spike-doped structures
○Safumi Suzuki・Kiyohito Sawada・Atsushi Teranishi・Masahiro Asada(Tokyo Inst. of Tech.)・Hiroki Sugiyama・Haruki Yokoyama(NTT)

(4) 16:25 - 16:40
Analysis of low loss and wideband characteristics for monolithic isolators using resonant tunneling diodes
○Nobuhiko Tanaka・Mitsufumi Saito・Michihiko Suhara(Tokyo Metro. Univ.)

(5) 16:40 - 16:55
Investigation of Abnormal Drain Current Increase of Tunneling Field-Effect Transistors
○Min Jin Lee・Woo Younhg Choi(Sogang Univ.)

(6) 16:55 - 17:10
A design of Novel IGBT with Oblique Trench Gate
Juhyun Oh・Dae Hwan Chun(Koria Univ.)・Eui Bok Lee(Koria Univ./KIST)・○Young Hwan Kim・Chun Keun Kim(KIST)・Byeong Kwon Ju・Man Young Sung(Koria Univ.)・Yong Tae Kim(KIST)

(7) 17:10 - 17:25
Electrical Characteristics of Atomic Layer Deposited Tungsten Nitride Diffusion Barrier for Cu Interconnects
○Yong Tae Kim(KIST)・Eui Bok Lee(Koria Univ./KIST)・Young Hwan Kim・Chun Keun Kim(KIST)・Byeong Kwon Ju(Koria Univ.)

6月30日(水) 午後 -Session 2B : Graphene and ?-?s- (14:25~16:30)

(1) 14:25 - 14:50
[招待講演]Synthesis of wafer scale graphene layer for future electronic devices
○Byung Jin Cho・Jeong Hun Mun(KAIST)

(2) 14:50 - 15:15
[招待講演]Graphene channel FET: A New Candidate for High-Speed Devices
○Tetsuya Suemitsu(Tohoku Univ.)

(3) 15:15 - 15:30
Deoxyribonucleic Acid Sensitive Graphene Field-Effect Transistors
○J. S. Hwang・H. T. Kim(Korea Univ.)・J. H. Lee・D. M. Whang(Korea Univ./Sungkyunkwan Univ.)・S. W. Hwang(Korea Univ.)

(4) 15:30 - 15:45
Fabrication of InP/InGaAs DHBTs with buried SiO2 wires
○Naoaki Takebe・Takashi Kobayashi・Hiroyuki Suzuki・Yasuyuki Miyamoto・Kazuhito Furuya(Tokyo Inst. of Tech.)

(5) 15:45 - 16:00
Reliability study on the emitter-base junction for high-speed sub-micron InP HBTs
○Yoshino K. Fukai・Kenji Kurishima・Norihide Kashio・Shoji Yamahata(NTT Photonics Labs.)

(6) 16:00 - 16:15
Electrochemical formation of InP porous structures for their application to photoelectric conversion devices
○Hiroyuki Okazaki・Taketomo Sato・Naoki Yoshizawa・Tamotsu Hashizume(Hokkaido Univ)

−−− 休憩 ( 15分 ) −−−

6月30日(水) 午後 -Session 3B : High Speed and High Frequency Applications 1- (16:30~17:30)

(1) 16:30 - 16:45
50-Gbit/s MUX/DEMUX IC modules using feed-trough type metal-wall package technique
○Satoshi Tsunashima・Michihiro Hirata・Koichi Murata(NTT Corp.)

(2) 16:45 - 17:00
94-GHz Monolithic Down-Converter for FMCW Radar Sensor using Metamorphic HEMTs
○Yong-Hyun Baek・Sang-Jin Lee・Tae-Jong Baek・Seok-Gyu Choi・Min Han・Dong-Sik Ko・Jin-Koo Rhee(Dongguk Univ.)

(3) 17:00 - 17:15
A Sub-Harmonic RF Transmitter Architecture with Simultaneous Power Combination and LO Leakage Cancellation
○Bongsub Song(Sogang Univ.)・Dohyung Kim(Samsung Electronics)・Jinwook Burm(Sogang Univ.)

(4) 17:15 - 17:30
RF Interconnect Technology for On-Chip and Off-Chip Communication
○Jongsun Kim(Hongik Univ.)・B. Byun・M.Frank Chang(Univ. of California)

7月1日(木) 午前 -Plenary Session 2- (09:30~10:20)

(1) 09:30 - 10:10
[基調講演]Future perspective for the mainstream CMOS technology and their contribution to green technologies
○Hiroshi Iwai(Tokyo Inst. of Tech.)

−−− 休憩 ( 10分 ) −−−

7月1日(木) 午前 -Session 4A : Channel Engineering- (10:20~11:50)

(1) 10:20 - 10:45
[招待講演]High Transport Si/SiGe Heterostructures for CMOS Transistors with Orientation and Strain Enhanced Mobility
○Jungwoo Oh・J. Huang・I. Ok・S. H. Lee・P. D. Kirsch・R. Jammy・Hi-Deok Lee(SEMATECH)

(2) 10:45 - 11:10
[招待講演]III-V/Ge CMOS technologies and heterogeneous integrations on Si platform
○Shinichi Takagi・Mitsuru Takenaka(Univ. of Tokyo.)

(3) 11:10 - 11:35
[招待講演]Stress and Surface Orientation Engineering in Scaled CMOSFETs Considering High-Field Carrier Transport
○Masumi Saitoh・Yukio Nakabayashi(Toshiba)・Ken Uchida(Tokyo Inst. of Tech.)・Toshinori Numata(Toshiba)

−−− 休憩 ( 15分 ) −−−

7月1日(木) 午前 -Session 5A : Emerging Device Technology 3- (11:50~13:05)

(4) 11:50 - 12:15
[招待講演]Si single-dopant devices and their characterization
○Michiharu Tabe・Daniel Moraru・Earfan Hamid・Miftahul Anwar・Arief Udhiarto・Ryusuke Nakamura・Sakito Miki・Takeshi Mizuno(Shizuoka Univ.)

(5) 12:15 - 12:40
[招待講演]Investigation on fabrication of nanoscale patterns using laser interference lithography
○Jinnil Choi・Jung Ho・Ki-Young Dong・Eun-Mi Park・Byeong-Kwon Ju(Korea Univ.)

(6) 12:40 - 13:05
[招待講演]Bottom-up synthesis of metal-free elementary semiconductor nanowires
○Dongmok Whang(Sungkyunkwan Univ.)・Sung Woo Hwang(Koria Univ.)

7月2日(金) 午前 -Session 6A : TFTs and Sensors- (09:30~11:15)

(1) 09:30 - 09:45
Fabrication of Oxide Thin Film Transistor based on SOG dielectric and solution ZnO
○Jung Ho Park・Jinnil Choi・Seongpil Chang・Ki-Young Dong・Eun-Mi Park・Byeong-Kwon Ju(Univ. of Korea)

(2) 09:45 - 10:00
Device Simulation of Amorphous Indium-Gallium-Zinc-Oxide Thin Film transistors with various interfacial Dielectric layers
○Hyo-seong Seong・Ji-hoon Son・Woo-sung Kim・Hong-seung Kim(Korea Maritime Univ.)・Woo-seok Cheong(ETRI)・Nak-won Jang(Korea Maritime Univ.)

(3) 10:00 - 10:15
Acivation behaviour for doped Si films after laser or furnace annealing
Takashi Noguchi・○Toshiharu Suzuki(Univ. of Ryukyus)

(4) 10:15 - 10:30
Strain effects in resistor stress sensor fabricated on (001) silicon and their influences on the determination of piezoresistive coefficients
○Chun-Hyung Cho・Ho-Young Cha(Hongik Univ.)

(5) 10:30 - 10:45
Fabrication of gas sensor using pd doped SnO2 nanotubes
○Ki-Young Dong・In-Sung Hwang・Dae-Jin Ham・Jinnil Choi・Jung-Ho Park・Jong-Heun Lee・Byeong-Kwon Ju(Korea Univ.)

(6) 10:45 - 11:00
Analysis of Transfer Gate in CMOS Image Sensor
○Seonghyung Park・Hyuk-Min Kwon・Jung-Deuk Bok・In-Shik Han・Woonil Choi・Hi-Deok Lee(Chungnam National Univ)

−−− 休憩 ( 15分 ) −−−

7月2日(金) 午前 -Session 7A : Gate Oxides- (11:15~14:15)

(1) 11:15 - 11:30
Interaction of bis-diethylaminosilane with hydroxylized Si (001) surface for SiO2 thin-film growth using density functional theory
○Seung-Bin Baek・Dae-Hee Kim(Korea Univ. of Tech. and Edu.)・Yong-Chan Jeong(ASM Genitech)・Yeong-Cheol Kim(Korea Univ. of Tech. and Edu.)

(2) 11:30 - 11:45
Electrical and structural properties of metal oxide semiconductor (MOS) devices with Pt/Ta2O5 gate stacks
○Hoon-Ki Lee・Jagadeesh Chandra・Kyu-Hwan Shim(Chonbuk National Univ.)・Hyung-Joong Yun・Jouhahn Lee(KBSI)・Chel-Jong Choi(Chonbuk National Univ.)

(3) 11:45 - 12:00
Modulation of PtSi work function by alloying with low work function metal
○Jun Gao・Jumpei Ishikawa・Shun-ichiro Ohmi(Tokyo Inst. of Tech.)

(4) 12:00 - 12:15
The Analysis of Temperature Dependency of the Mobility In High-k/Metal Gate MOSFET and the Performance on its CMOS Inverter
○Takeshi Sasaki・Takuya Imamoto・Tetsuo Endoh(Tohoku Univ.)

(5) 12:15 - 12:30
High Integrity Gate Insulator Films on Atomically Flat Silicon Surface
○Xiang Li・Rihito Kuroda・Tomoyuki Suwa・Akinobu Teramoto・Shigetoshi Sugawa・Tadahiro Ohmi(Tohoku Univ.)

(6) 12:30 - 12:45
Characterization of Mg Diffusion into HfO2/SiO2/Si(100) Stacked Structures and Its Impact on Detect State Densities
○Akio Ohta・Daisuke Kanme・Hideki Murakami・Seiichiro Higashi・Seiichi Miyazaki(Hiroshima Univ.)

(7) 12:45 - 13:00
Evaluation of 1/f Noise Characteristics in High-k/Metal Gate and SiON/Poly-Si Gate MOSFET
○Takuya Imamoto・Takeshi Sasaki・Tetsuo Endoh(Tohoku Univ.)

−−− 昼食 ( 75分 ) −−−

7月2日(金) 午後 -Session 8A : Memory 2- (14:15~16:50)

(1) 14:15 - 14:40
[招待講演]High-k materials and poly-Si nanowires in nonvolatile memory for 3D flash memory and display panel applications
○Yung-Chun Wu・Min-Feng Hung・Jiang-Hung Chen・Lun-Chun Chen・Ji-Hong Jiang(National Tsing Hua Univ. Taiwan)

(2) 14:40 - 15:05
[招待講演]A Single Element Phase Transition Memory
Sang-Hyeon Lee・○Moonkyung Kim(Cornell Univ.)・Byung-ki Cheong(KIST)・Jooyeon Kim(Ulsan College)・Jo-Won Lee(National Program for Tera-level Nano Devices, Korea)・Sandip Tiwari(Cornell Univ.)

(3) 15:05 - 15:20
Impact of Floating Body type DRAM with the Vertical MOSFET
○Yuto Norifusa・Tetsuo Endoh(Tohoku Univ./JST)

−−− 休憩 ( 15分 ) −−−

(4) 15:35 - 15:50
Independent Gate Twin-bit SONOS Flash Memory with Split-gate Effect
○Yoon Kim・Jang-Gn Yun・Jung Hoon Lee・Gil Sung Lee・Se Hwan Park・Jong-Ho Lee・Hyungcheol Shin・Byung-Gook Park(Seoul National Univ.)

(5) 15:50 - 16:05
Theoretical Study of the Hydrogen Effect on the Program/Erase Cycle of MONOS-Type Memories
Akira Otake・○Keita Yamaguchi・Kenji Shiraishi(Univ. of Tsukuba.)

(6) 16:05 - 16:20
The optimum physical targets of the 3-dimensional vertical FG NAND flash memory cell arrays with the extended sidewall control gate (ESCG) structure
○Moon-Sik Seo(Tohoku Univ.)・Tetsuo Endoh(Tohoku Univ./JST)

(7) 16:20 - 16:35
New Method for Evaluating the Scaling Trend of Nano-Electro-Mechanical (NEM) Nonvolatile Memory Cells
○Seung Hyeun Roh・Woo Young Choi(Sogang Univ.)

−−− 休憩 ( 5分 ) −−−

−−− 委員長挨拶 ( 10分 ) −−−

7月2日(金) 午前 -Session 6B : Wide Bandgap Materials and Devices, Power Devices- (09:30~11:35)

(1) 09:30 - 09:55
[招待講演]Development of Low on-resistance SiC Trench MOSFET and other SiC power devices
○Yuki Nakano・Ryota Nakamura・Katsuhisa Nagao・Takashi Nakamura・Hidemi Takasu(ROHM)

(2) 09:55 - 10:10
Effects of Field Plate and Buried Gate Structures on Silicon Carbide Metal-Semiconductor Field-Effect Transistors
○Jaegil Lee・Chun-Hyung Cho・Ho-Young Cha(Hongik Univ.)

(3) 10:10 - 10:35
[招待講演]InAlN/GaN HEMT Structures on 4-in Silicon Grown by MOCVD
○Makoto Miyoshi・Shigeaki Sumiya・Mikiya Ichimura・Tomohiko Sugiyama・Sota Maehara・Mitsuhiro Tanaka(NGK)・Takashi Egawa(Nagoya Inst. of Tech.)

(4) 10:35 - 10:50
A comparative study on AlGaN/GaN based HEMT and MIS-HEMT with Al2O3 as gate dielectric
○Joseph Freedsman・Arata Watanabe・Lawrence Selvaraj・Takashi Egawa(Nagoya Inst. of Tech.)

(5) 10:50 - 11:05
Characterization of deep electron levels of AlGaN grown by MOVPE
○Kimihito Ooyama(Hokkaido Univ./SMM)・Katsuya Sugawara(Hokkaido Univ.)・Hiroyuki Taketomi・Hideto Miyake・Kazumasa Hiramatsu(Mie Univ.)・Tamotsu Hashizume(Hokkaido Univ./JST)

(6) 11:05 - 11:20
Characteristics of GaN p-n diode with damage layer induced by ICP plasma process
○Tsutomu Uesugi・Tetsu Kachi(Toyota Central R&D Labs.)・Tamotsu Hashizume(Hokkaido Univ.)

−−− 休憩 ( 15分 ) −−−

7月2日(金) 午前 -Session 7B : Si IC and Circuit Technology- (11:35~14:15)

(1) 11:35 - 11:50
The Impact of Current Controlled-MOS Current Mode Logic /Magnetic Tunnel Junction Hybrid Circuit for Stable and High-speed Operation
○Tetsuo Endoh・Masashi Kamiyanagi・Masakazu Muraguchi・Takuya Imamoto・Takeshi Sasaki(Tohoku Univ.)

(2) 11:50 - 12:05
Verification of Stable Circuit Operation of 180nm Current Controlled MOS Current Mode Logic under Threshold Voltage Fluctuation
○Masashi Kamiyanagi・Takuya Imamoto・Takeshi Sasaki・Hyoungjun Na・Tetsuo Endoh(Tohoku Univ.)

(3) 12:05 - 12:20
A Non-snapback NMOS ESD Clamp Circuit using Gate-Coupled Scheme with Isolated Well in a Bipolar-CMOS-DMOS Process
○Jae-Young Park・Dae-Woo Kim・Young-San Son・Jong-Chan Ha・Jong-Kyu Song・Chang-Soo Jang・Won-Young Jung(Dongbu HiTek)

(4) 12:20 - 12:35
A Precision Floating-Gate Mismatch Measurement Technique for Analog Applications
○Won-Young Jung・Jong Min Kim・Jin-Soo Kim・Taek-Soo Kim(Dongbu HiTek)

(5) 12:35 - 12:50
A Physical-Based Modeling for Accurate Wide-Width LDMOS
○Won-Young Jung・Jong-Sub Lee・Eun-Jin Kim・Ki-Jung Park・San-Hun Kwak・Jin-Soo Kim・Taek-Soo Kim(Dongbu HiTek)

(6) 12:50 - 13:05
Over 1GHz High-Speed Current Pulse Generation Circuit for Novel Nonvolatile Memory Cells
○Tetsuo Endoh・Yasuhiko Suzuki・Takuya Imamoto・Hyoungjun Na(Tohoku Univ.)

−−− 昼食 ( 70分 ) −−−

7月2日(金) 午後 -Session 8B : High Speed and High Frequency Applications 2- (14:15~15:30)

(7) 14:15 - 14:30
A V-band Common-Source Low Noise Amplifier in 0.13 μm RFCMOS Technology
○Sung-Jin Kim・Dong-Hyun Kim・Jae-Sung Rieh(Korea Univ.)

(8) 14:30 - 14:45
A 0.18 um CMOS process 10-PAM transceiver for 10 Gigabit Ethernet
○Nayeon Cho・J K Jeong・J J Lee・J Burm(Sogang Univ.)

(9) 14:45 - 15:00
A Switched-Capacitor Integrator Using Dynamic Source-Follower Amplifiers
○Ryoto Yaguchi・Fumiyuki Adachi・Takao Waho(Sophia Univ.)

(10) 15:00 - 15:15
A Basic Study on RF Characteristics of Short Wavelength Comb-type Transmission Line on MMIC
○Jang-Hyeon Jeong・Young-Bae Park・Bo-Ra Jung・Jeong-Gab Ju・Eui-Hoon Jang・Chi-Hong Min・Seong-Il Hong・Suk-Youb Kang・Hong Seung Kim・Young Yun(Korea Maritime Univ.)

−−− 休憩 ( 15分 ) −−−

7月2日(金) 午後 -Session 9B : Nano-Scale devices and Physics- (15:30~16:40)

(1) 15:30 - 15:45
High Current Drivability FD-SOI CMOS with Low Source/Drain Series Resistance
○Yukihisa Nakao・Rihito Kuroda・Hiroaki Tanaka・Akinobu Teramoto・Shigetoshi Sugawa・Tadahiro Ohmi(Tohoku Univ.)

(2) 15:45 - 16:00
Study on Impurity Distribution Dependence of Electron-Dynamics in Vertical MOSFET
○Masakazu Muraguchi・Tetsuo Endoh(Tohoku Univ./JST)

(3) 16:00 - 16:15
Characteristic of Dual-Gate Single Electron Transistor (DG-SET) with extended channel using shallow doping and sidewall patterning for suppressing MOS current
○Joung-eob Lee・Kwon-Chil Kang・Jung Han Lee・Kim Kyung Wan・Byung-Gook Park(Seoul National Univ.)

(4) 16:15 - 16:30
Study on Collective Electron Motion in Si-Nano Dot Floating Gate MOS Capacitor
○Masakazu Muraguchi(Tohoku Univ.)・Yoko Sakurai・Yukihiro Takada・Shintaro Nomura・Kenji Shiraishi(Univ. of Tsukuba.)・Mitsuhisa Ikeda・Katsunori Makihara・Seiichi Miyazaki(Hiroshima Univ.)・Yasuteru Shigeta(Univ. of Hyogo)・Tetsuo Endoh(Tohoku Univ.)

−−− 休憩 ( 10分 ) −−−

一般講演:発表 12 分 + 質疑応答 3 分
招待講演:発表 20 分 + 質疑応答 5 分
基調講演:発表 35 分 + 質疑応答 5 分

◆The Institute of Electronics Engineers of Korea (IEEK),Global COE Program “Photonics Integration-Core Electronics”(東京工業大学) 共催


☆ED研究会今後の予定 [ ]内発表申込締切日

9月13日(月) (開催日変更) 九州工業大(若松キャンパス) [7月16日(金)] テーマ:センサデバイス、MEMS、一般

【問合先】
原 直紀 (富士通研究所)
TEL : 046-250-8242、FAX : 046-250-8168
E-mail : o
津田 邦男(東芝)
TEL : 044-549-2142、FAX : 044-520-1501
E-mail : oba
須原 理彦(首都大)
TEL : 042-677-2765 Fax : 042-677-2756
E-mail : t
上田 哲三(パナソニック)
TEL : 075-956-8273 Fax : 075-956-9110
E-mail : zopac

☆SDM研究会今後の予定 [ ]内発表申込締切日

8月26日(木)~27日(金) 札幌エルプラザ内男女共同参画センター [6月9日(水)] テーマ:低電圧/低消費電力技術、新デバイス・回路とその応用

【問合先】
小野 行徳(NTT)
Phone 046-240-2641 Fax 046-240-4317
E-mail: oaecl


Last modified: 2010-06-10 10:41:43


ご注意: 迷惑メール対策のためメールアドレスの一部の文字を置換しております.ご了承ください.

[この開催に関する講演論文リストをダウンロードする] ※ こちらのページの最下にあるダウンロードボタンを押してください
 
[研究会資料インデックス(vol. no.ごとの表紙と目次)]
 

[研究会発表・参加方法,FAQ] ※ ご一読ください
 

[ED研究会のスケジュールに戻る]   /   [SDM研究会のスケジュールに戻る]   /  
 
 トップ  戻る   / [HTML] / [HTML(simple)] / [TEXT]  [Japanese] / [English] 


[研究会発表申込システムのトップページに戻る]

[電子情報通信学会ホームページ]


IEICE / 電子情報通信学会