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Chair |
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Minoru Fujishima (Hiroshima Univ.) |
Vice Chair |
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Hideto Hidaka (Renesas) |
Secretary |
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Takeshi Yoshida (Hiroshima Univ.) |
Assistant |
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Makoto Takamiya (Univ. of Tokyo), Hiroe Iwasaki (NTT), Takashi Hashimoto (Panasonic), Hiroyuki Ito (Tokyo Inst. of Tech.), Pham Konkuha (Univ. of Electro-Comm.) |
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Conference Date |
Thu, Apr 14, 2016 10:10 - 17:05
Fri, Apr 15, 2016 09:30 - 11:45 |
Topics |
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Conference Place |
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Thu, Apr 14 AM 10:10 - 11:50 |
(1) |
10:10-10:35 |
[Invited Lecture]
A Cost Effective Test Screening Method on 40-nm 4-Mb Embedded SRAM for Low-power MCU |
Yuta Yoshida (RSD), Yoshisato Yokoyama, Yuichiro Ishii (Renesas Electronics), Toshihiro Inada, Koji Tanaka, Miki Tanaka, Yoshiki Tsujihashi (RSD), Koji Nii (Renesas Electronics) |
(2) |
10:35-11:00 |
[Invited Lecture]
A 7T-SRAM with Data-Write Technique by Capacitive Coupling |
Daisaburo Takashima, Masato Endo (Toshiba), Kazuhiro Shimazaki, Manabu Sai (Toshiba Microelectronics), Masaaki Tanino (Toshia Information Systems) |
(3) |
11:00-11:25 |
[Invited Lecture]
A 298-fJ/writecycle 650-fJ/readcycle 8T Three-Port SRAM in 28-nm FD-SOI Process Technology for Image Processor |
Haruki Mori, Tomoki Nakagawa, Yuki Kitahara, Yuta Kawamoto, Kenta Takagi, Shusuke Yoshimoto, Shintaro Izumi (Kobe Univ.), Koji Nii (Renesas Electronics), Hiroshi Kawaguchi, Masahiko Yoshimoto (Kobe Univ.) |
(4) |
11:25-11:50 |
A 64kb 16nm Asynchronous Disturb Current Free 2-Port SRAM with PMOS Pass-Gates for FinFET Technologies |
Hidehiro Fujiwara, Li-Wen Wang, Yen-Huei Chen, Koo-Cheng Lin, Dar Sun, Shin-Rung Wu, Jhon-Jhy Liaw, Chin-Yung Lin, Mu-Chi Chiang, Hung-Jen Liao, Shien-Yang Wu, Jonathan Chang (TSMC) |
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11:50-13:00 |
( 70 min. ) |
Thu, Apr 14 PM 13:00 - 14:40 |
(5) |
13:00-13:25 |
[Invited Lecture]
Visualization of Filament of ReRAM during Resistive Switching by in-situ Transmission Electron Microscopy |
Yasuo Takahashi (Hokkaido Univ.), Masaki Kudo (Kyusyu Univ.), Masashi Arita (Hokkaido Univ.) |
(6) |
13:25-13:50 |
[Invited Lecture]
A 0.6V Operation ReRAM Program Voltage Generator with Adaptively Optimized Comparator Bias-Current for Batteryless IoT Local Device |
Masahiro Tanaka, Tomoya Ishii, Shogo Hachiya, Sheyang Ning, Ken Takeuchi (Chuo Univ.) |
(7) |
13:50-14:15 |
[Invited Lecture]
Reliability Projecting for ReRAM based on Stochastic Differential Equation |
Zhiqiang Wei (PSCS), Koji Eriguchi (Kyoto Univ.), Shunsaku Muraoka, Koji Katayama, Ryotaro Yasuhara, Kawai Ken, Yukio Hayakawa, Kazuhiko Shimakawa, Takumi Mikawa, Yoneda Shinichi (PSCS) |
(8) |
14:15-14:40 |
[Invited Lecture]
ReRAM reliability characterization and improvement by machine learning |
Tomoko Ogura Iwasaki, Sheyang Ning, Hiroki Yamazawa, Chao Sun, Shuhei Tanakamaru, Ken Takeuchi (Chuo Univ.) |
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14:40-14:50 |
Break ( 10 min. ) |
Thu, Apr 14 PM 14:50 - 17:05 |
(9) |
14:50-15:15 |
[Invited Lecture]
A Triple-Protection Structured COB FRAM with 1.2-V Operation and 1E17-Cycle Endurance |
Hitoshi Saito, Ko Nakamura, Soichiro Ozawa, Naoya Sashida, Satoru Mihara, Yukinobu Hikosaka, Wensheng Wang, Tomoyuki Hori, Kazuaki Takai, Mitsuharu Nakazawa, Noboru Kosugi, Makoto Hamada, Shoichiro Kawashima, Takashi Eshita, Masato Matsumiya (FSL) |
(10) |
15:15-15:40 |
[Invited Lecture]
1T1MTJ STT-MRAM Cell Array Design with an Adaptive Reference Voltage Generator |
Hiroki Koike, Sadahiko Miura, Hiroaki Honjo, Tosinari Watanabe, Hideo Sato, Soshi Sato, Takashi Nasuno, Yasuo Noguchi, Mitsuo Yasuhira, Takaho Tanigawa, Masaaki Niwa, Kenchi Ito, Shoji Ikeda, Hideo Ohno, Tetsuo Endoh (Tohoku Univ.) |
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15:40-15:50 |
Break ( 10 min. ) |
(11) |
15:50-16:15 |
[Invited Lecture]
Power reduction based on MRAM |
Hiroaki Yoda, Shinobu Fujita (toshiba) |
(12) |
16:15-17:05 |
[Invited Talk]
Technology trends and near-future applications of embedded STT-MRAM |
Shinobu Fujita (Toshiba) |
Fri, Apr 15 AM 09:30 - 11:45 |
(13) |
09:30-09:55 |
[Invited Lecture]
Faster LBA scrambler utilized SSD with Garbage Collection Optimization |
Chihiro Matsui, Asuka Arakawa, Chao Sun, Tomoko Ogura Iwasaki, Ken Takeuchi (Chuo Univ.) |
(14) |
09:55-10:20 |
[Invited Lecture]
Design of SCM/NAND Flash Hybrid SSD System for Each Data Access Pattern |
Tomoaki Yamada, Shun Okamoto, Chao Sun, Shogo Hachiya, Tomoko Ogura Iwasaki, Ken Takeuchi (Chuo Univ.) |
(15) |
10:20-10:45 |
[Invited Lecture]
Highly Reliable Method for Long-Term Semiconductor Data Storage |
Tomonori Takahashi, Senju Yamazaki, Shuhei Tanakamaru, Tomoko Ogura Iwasaki, Shogo Hachiya, Ken Takeuchi (Chuo Univ.) |
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10:45-10:55 |
Break ( 10 min. ) |
(16) |
10:55-11:45 |
[Invited Talk]
A 90nm Embedded 1T-MONOS Flash Macro for Automotive Applications with 0.07mJ/8kB Rewrite Energy and Endurance Over 100M Cycles Under Tj of 175°C |
Satoru Nakanishi, Hidenori Mitani, Ken Matsubara, Hiroshi Yoshida, Takashi Kono, Yasuhiko Taito, Takashi Ito, Takashi Kurafuji, Kenji Noguchi, Hideto Hidaka, Tadaaki Yamauchi (Renesas) |
Announcement for Speakers |
General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
Invited Lecture | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
Invited Talk | Each speech will have 45 minutes for presentation and 5 minutes for discussion. |
Contact Address and Latest Schedule Information |
ICD |
Technical Committee on Integrated Circuits and Devices (ICD) [Latest Schedule]
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Contact Address |
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Last modified: 2016-04-01 10:04:12
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