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=============================================== Technical Committee on Electromechanical Devices (EMD) Chair: Junya Sekikawa (Shizuoka Univ.) Vice Chair: Yoshiteru Abe (NTT) Secretary: Shigeru Sawada (Sumitomo Denso), Kenji Suzuki (Fujielectric) Assistant: Shinichi Wada (TMC system) =============================================== Technical Committee on Reliability (R) Chair: Hiroyasu Mawatari (NTT) Vice Chair: Tetsushi Yuge (National Defense Academy) Secretary: Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.) Assistant: Maratt Zanikef (Kyushu Inst. of Tech.), Nobuyuki Tamura (Hosei Univ.) DATE: Fri, Feb 19, 2016 13:20 - 16:00 PLACE: Azarea(Shizuoka city) TOPICS: ---------------------------------------- Fri, Feb 19 PM (13:15 - 14:35) ---------------------------------------- ----- Opening Address ( 5 min. ) ----- (1) 13:20 - 13:45 Investigation of Electrical Contacts on a Nanometer Scale using a Nano-manipulator in Scanning Electron Microscope Jun Toyoizumi, Masanori Onuma, Takaya Kondo, Kikuo Mori (yazaki), Tetsuo Shimizu, Sumiko Kawabata, Norimichi Watanabe (AIST) (2) 13:45 - 14:10 Characterization of Contact Oil in Electrical Contacts by the Alternating Current Impedance Method Fumitaka Teraoka, Kazuo Iida (Mie Univ.), Shigeru Sawada, Atsushi Shimizu (AutoNetworks Tech.) (3) 14:10 - 14:35 Dependence of time evolution of contact resistance at the closed electrical contacts (6) Keita Miyashige, Sekikawa Junya (Shizuoka Univ.) ----- Break ( 10 min. ) ----- ---------------------------------------- Fri, Feb 19 PM (14:45 - 16:00) ---------------------------------------- (4) 14:45 - 15:10 Restriction on Moving of Break Arcs Magnetically Blown-out with a High Polymer Material Keisuke Kato, Junya Sekikawa (Shizuoka Univ.) (5) 15:10 - 15:35 Study on microscopic deformation of connecting points for fiber-optic connectors (2) Sirou Aono, Katsuyoshi Sakaime, Daisuke Saegusa, Ryo Nagase (CIT) (6) 15:35 - 16:00 Latest Trends of JIS Z8115 DependabilityTerminology amendment drafts -- Focus on relevant terms of failure and fault -- Fumiaki Harada (FXAT), AKihiko Masuda (R7 Studio), Tateki NIsh (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental motor) ----- Closeing Address ( 5 min. ) ----- # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan. === Technical Committee on Electromechanical Devices (EMD) === # FUTURE SCHEDULE: Fri, Mar 4, 2016: [Fri, Jan 15] Fri, May 20, 2016: Chitose Arcadia Plaza [Fri, Mar 25] # SECRETARY: Junya Sekikawa (Shizuoka Univ.) TEL (053) 478-1618、FAX (053) 478-1618 E-mail: tj   k ipc     Nobuhiro Kuga（Yokohama National Univ.） TEL (045)339-4279、FAX (045)339-4279 E-mail:   y Shigeru Sawada（Sumitomo Wiring Systems, Ltd.) TEL (059)382-8654、FAX (059)382-8591 E-mail: ge -    sws Yoshiteru Abe（NTT Device Innovation Center)] TEL (046)240-2262、FAX (046)270-6421 E-mail: abe    # ANNOUNCEMENT: # Latest information will be presented on the homepage: http://www.ieice.org/es/emd/jpn/ === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Sat, May 28, 2016: WINC AICHI [Fri, Mar 18], Topics: Software Reliability, Overall reliability engineering # SECRETARY: Hiroyuki Okamura (Hiroshima Univ.) E-mail:   l   -uLast modified: 2016-01-28 15:26:18 |
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