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Chair |
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Akira Asato (Fujitsu) |
Vice Chair |
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Tadashi Dohi (Hiroshima Univ.) |
Secretary |
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Nobuyuki Tamura (Hosei Univ.), Shinji Inoue (Kansai Univ.) |
Assistant |
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Hiroyuki Okamura (Hiroshima Univ.), Shinji Yokogawa (Univ. of Electro-Comm.) |
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Conference Date |
Mon, Nov 30, 2020 13:00 - 16:10 |
Topics |
Reliability of semiconductor and electronic devices, Reliability general |
Conference Place |
Online |
Contact Person |
Prof. Shinji Inoue
+81-72-690-2453 |
Sponsors |
This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
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Registration Fee |
This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on R. |
Mon, Nov 30 PM 13:00 - 16:10 |
(1) |
13:00-13:25 |
Ant Colony Optimization Algorithm Based on Birnbaum Importance and Necessary Condition for Optimal Arrangement Problems in a Linear Consecutive-k-out-of-n: F System |
Issin Honma, Hisashi Yamamoto (Tokyo Metropolitan Univ.), Taishin Nakamura (Tokai Univ.) |
(2) |
13:25-13:50 |
On Software Safety Integrity Assessment for E/E/PE Safety-Related Systems |
Shinji Inoue (Kansai Univ.), Takaji Fujiwara (SRATECH Lab. Inc.), Shigeru Yamada (Tottori Univ.) |
(3) |
13:50-14:15 |
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14:15-14:30 |
Break ( 15 min. ) |
(4) |
14:30-14:55 |
Verification of effect by comparison of temperature cycle test and thermal shock test |
Yuri Saito, Matsuguma Osamu, Aoki Yuichi (ESPEC) |
(5) |
14:55-15:20 |
Analysis for Degraded MLCC Using Voltage Contrast Method in SEM |
Akira Saito (Murata) |
(6) |
15:20-15:45 |
Stochastic Modeling and Filtering for Reliability Predictions of Degradation Processes |
Toru Kaise (Univ. of Hyogo) |
(7) |
15:45-16:10 |
A Study for Accelerated Humidity Stress Test (part 3) |
Sadanori Itou (Itoken) |
Announcement for Speakers |
General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
Contact Address and Latest Schedule Information |
R |
Technical Committee on Reliability (R) [Latest Schedule]
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Contact Address |
Shinji Inoue (Kansai Univ.)
E-: ini-u |
Last modified: 2020-10-02 18:08:58
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