Wed, Feb 26 AM
10:00 - 11:35 |
| (1) |
10:00-10:25 |
On Machine Learning Based Accuracy Improvement for A Digital Temperature and Voltage Sensor |
Masayuki Gondo, Yousuke Miyake, Seiji Kajihara (Kyutech) |
| (2) |
10:25-10:50 |
Defective Chip Prediction Modeling Using Convolutional Neural Networks |
Ryunosuke Oka, Satoshi Ohtake (Oita Univ.), Kouichi Kumaki (Renesas) |
| (3) |
10:50-11:15 |
A study on temperature dependence on discrimination of resistive opens using machine learning-based anomaly detection |
Ryotaroh Nakanishi, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) |
| |
11:15-11:35 |
Break ( 20 min. ) |
Wed, Feb 26 AM
11:35 - 14:10 |
| (4) |
11:35-12:00 |
Method for Inserting Fault-Detection-Strengthened Test Point under Multi-cycle Testing |
Tomoki Aono, Norihiro Nakaoka, Shyu Saikou, Wang Senling, Higami Yoshinobu, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Youichi Maeda, Jun Matsushima (Renesas) |
| (5) |
12:00-12:25 |
A controller augmentation method to reduce the number of untestable faults for multiplexers with n-inputs |
Yuki Takeuchi, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) |
| (6) |
12:25-12:50 |
Glitch PUF utilizing Unrolled Architecture and its Evaluation |
Yusuke Nozaki, Masaya Yoshikawa (Meijo Univ.) |
| |
12:50-14:10 |
Break ( 80 min. ) |
Wed, Feb 26 PM
14:10 - 15:45 |
| (7) |
14:10-14:35 |
A Don’t Care Identification-Filling Co-Optimization Method for Low Power Testing Using Partial Max-SAT |
Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ), Masayuki Arai (Nihon Univ) |
| (8) |
14:35-15:00 |
Power Analysis for Logic Area of LSI Including Memory Area |
Yuya Kodama, Kohei Miyase, Daiki Takafuji, Xiaoqing Wen, Seiji Kajihara (Kyutech) |
| (9) |
15:00-15:25 |
Improving Controllability of Signal Transitions in the High Switching Area of LSI |
Jie Shi, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) |
| |
15:25-15:45 |
Break ( 20 min. ) |
Wed, Feb 26 PM 三宅 庸資(九工大)
15:45 - 17:00 |
| (10) |
15:45-16:10 |
Frequency Variation of Ring Oscillators During Long-Time Operation on FPGA |
Shingo Tsutsumi, Yukiya Miura (Tokyo Metropolitan Univ.) |
| (11) |
16:10-16:35 |
Accurate Recycled FPGA Detection Based on Exhaustive Path Analysis |
Michihiro Shintani, Foisal Ahmed, Michiko Inoue (NAIST) |
| (12) |
16:35-17:00 |
Soft Error Tolerance of Power-Supply-Noise Hardened Latches |
Yuya Kinoshita, Yukiya Miura (Tokyo Metropolitan Univ.) |
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