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=============================================== Technical Committee on Reliability (R) Chair: Tetsushi Yuge (National Defense Academy) Vice Chair: Akira Asato (Fujitsu) Secretary: Nobuyuki Tamura (Hosei Univ.), Shigeto Hiraguri (RTRI) Assistant: Shinji Inoue (Kansai Univ.), Hiroyuki Okamura (Hiroshima Univ.) DATE: Thu, Nov 15, 2018 14:00 - 16:20 PLACE: TOPICS: ---------------------------------------- Thu, Nov 15 PM (14:00 - 16:20) ---------------------------------------- (1) 14:00 - 14:25 A Study for Accelerated Humidity Stress Test (Part 2) Sadanori Ito (itoken) (2) 14:25 - 14:50 The study of Acceleration model Based on the Step Stress test (2) Toshinari Matsuoka (MELCO) ----- Break ( 15 min. ) ----- (3) 15:05 - 15:30 Reliability Analysis Based on Hierarchical Bayesian Models Using Deep Learning Methods Toru Kaise (Univ. of Hyogo) (4) 15:30 - 15:55 A Study of Bayesian Statistical Analysis for Failure Number Data Toru Kaise (Uni. of Hyogo) (5) 15:55 - 16:20 Some topics on common-cause failure analysis Tetsushi Yuge (NDA) # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by Kansai Branch of Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter. === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Sat, Dec 15, 2018: [Mon, Oct 15] Fri, Feb 15, 2019: [Thu, Dec 20] # SECRETARY: Hiroyuki Okamura (Hiroshima Univ.) E-mail:        -u Last modified: 2018-09-21 15:22:03 |
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