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Technical Committee on Reliability (R) [schedule] [select]
Chair Tadashi Dohi (Hiroshima Univ.)
Vice Chair Yasushi Kadota (Ricoh)
Secretary Hiroyuki Okamura (Hiroshima Univ.), Shinji Inoue (Kansai Univ.)
Assistant Shinji Yokogawa (Univ. of Electro-Comm.), Takahide Yoshikawa (Fujitsu Lab.), Takenori Sakumura (Housei Univ.)

Conference Date Tue, Nov 30, 2021 13:00 - 15:40
Topics Reliability of semiconductor and electronic devices, Reliability ge 
Conference Place Online 
Sponsors This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Registration Fee This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on R.

Tue, Nov 30 PM 
13:00 - 15:40
(1) 13:00-13:25 A Note on Performance Evaluation of Cloud Datacenters using CPU Utilization Data R2021-34 Chen Li (Kyutech), Junjun Zheng (Ritsumeikan Univ.), Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)
(2) 13:25-13:50 Predicting Vulnerability Discovery Processes in Support Periods for an Operating System R2021-35 Kento Kubota, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.)
(3) 13:50-14:15 Extended Error Correction Codes for Burst Errors and Discrete Errors in Small-Scale Circuits R2021-36 Atsushi Miki (Fujitsu)
  14:15-14:25 Break ( 10 min. )
(4) 14:25-14:50 Queueing simulation of faults correction based on software reliability growth models R2021-37 Yuka Minamino (Tottori Univ.), Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.)
(5) 14:50-15:15 Safety Analysis for Safety-Related Software Based on a Fault Detection Count Model R2021-38 Shinji Inoue (Kansai Univ.), Takaji Fujiwara (SRATECH Lab.), Shigeru Yamada (Tottori Univ.)
(6) 15:15-15:40 Bayesian Reliability Analysis Based on State Space Models for Monitoring Data Toru Kaise (Univ. of Hyogo)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Shinji Inoue (Kansai Univ.)
E-: ini-u 


Last modified: 2021-09-15 18:54:35


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