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Technical Committee on Component Parts and Materials (CPM)
Chair: Kiyoshi Ishii Vice Chair: Kiichi Kamimura
Secretary: Toru Matsuura, Seiji Toyoda
Assistant: Hidehiko Shimizu, Yasushi Takemura

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Technical Committee on Integrated Circuits and Devices (ICD)
Chair: Masao Nakaya Vice Chair: Akira Matsuzawa
Secretary: Koji Kai, Yoshiharu Aimoto
Assistant: Makoto Nagata, Minoru Fujishima

DATE:
Thu, Jan 18, 2007 09:00 - 17:00
Fri, Jan 19, 2007 09:00 - 16:35

PLACE:


TOPICS:
LSI system assembly and module/inteface technology, test, general

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Thu, Jan 18 AM (09:00 - 10:40)
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(1) 09:00 - 09:25
On-Die Monitoring of Substrate Coupling for Mixed-Signal Circuit Isolation
Takumi Danjo, Daisuke Kosaka, Makoto Nagata (Kobe Univ.)

(2) 09:25 - 09:50
Study on Active Substrate Noise Cancelling Technique using Power Line di/dt Detector
Taisuke Kazama (Univ. of Tokyo), Makoto Ikeda, Kunihiro Asada (VDEC)

(3) 09:50 - 10:15
Measurement of Delay Variation Due to Inductive Coupling Noise in 90nm Global Interconnects
Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye (Osaka Univ.)

(4) 10:15 - 10:40
Measurement of Delay Degradation Due to Power Supply Noise and Delay Variation Estimation with Full-Chip Simulation
Yasuhiro Ogasahara, Takashi Enami, Masanori Hashimoto (Osaka Univ.), Takashi Sato (Tokyo Inst. Tech.), Takao Onoye (Osaka Univ.)

----- Break ( 15 min. ) -----

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Thu, Jan 18 AM (10:55 - 12:10)
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(5) 10:55 - 11:20
Delay Variation Analysis in Consideration of Dynamic Power Supply Noise Waveform
Mitsuya Fukazawa, Makoto Nagata (Kobe Univ.)

(6) 11:20 - 12:10
[Special Invited Talk]
Proximity Inter-chip Communications
Tadahiro Kuroda, Kiichi Niitsu (Keio Univ.)

----- Lunch Break ( 50 min. ) -----

----------------------------------------
Thu, Jan 18 PM (13:00 - 15:05)
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(7) 13:00 - 13:50
[Invited Talk]
Fine electronic cuircuit pattern formation by various metal nanoparticle pastes
-- Approach by the design of metal nanoparticles --
Masami Nakamoto (Osaka Munic. Tech. Res. Inst.)

(8) 13:50 - 14:15
“In Situ” Evaluation for On-Chip Inductors Using Impedance Balance Method
Mizuki Motoyoshi, Minoru Fujishima (The Univ. of Tokyo)

(9) 14:15 - 14:40
Design of Wideband tuning VCO for TV Receiver System
Takatsugu Kamata, Toshimasa Matsuoka, Kenji Taniguchi (Osaka Univ.)

(10) 14:40 - 15:05
An Integrated 20-26 GHz CMOS Up-Conversion Mixer with Low Power Consumption
Yuki Kambayashi, Ivan Chee Hong Lai, Minoru Fujishima (U.T.)

----- Break ( 15 min. ) -----

----------------------------------------
Thu, Jan 18 PM (15:20 - 17:00)
----------------------------------------

(11) 15:20 - 16:10
[Special Invited Talk]
3-Dimensional Packaging Technology and Super-Chip Integration
Tetsu Tanaka, Takafumi Fukushima, Mitsumasa Koyanagi (Tohoku Univ.)

----- Break(Presentation cancel) ( 25 min. ) -----

(12) 16:35 - 17:00
Local deformation and residual stress of thin chips stacked by flip chip structures
Hideo Miura, Nobuki Ueta, Yuki Sato (Tohoku Univ.)

----------------------------------------
Fri, Jan 19 AM (09:00 - 10:40)
----------------------------------------

(13) 09:00 - 09:25
Development of Packages for Ultra-violet Light-Emitting Diodes
-- Approach to high-light-extraction efficiency by Flip-Chip packages --
Iwao Mitsuishi, Shinya Nunoue, Hiroshi Yamada, Shinya Nunoue (Toshiba)

(14) 09:25 - 09:50
Ultra-Fine Pitch Cu Bumpless Interconnect for High Density System Integration
Aktisu Shigetou, Toshihiro Itoh, Tadatomo Suga (Univ. of Tokyo)

(15) 09:50 - 10:15
Modeling of Wire Bonding Process for High Performance Device
Eiichi Yamada, Masazumi Amagai (TI Japan)

(16) 10:15 - 10:40
Signal Transmission Guideline in IC Package
Kentaro Takao, Chikara Azuma, Masazumi Amagai (TIJ)

----- Break ( 15 min. ) -----

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Fri, Jan 19 AM (10:55 - 12:10)
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(17) 10:55 - 11:20
Failure analysis system to classify failure modes using combination of FBMs
Hitoshi Maeda, Fumihito Ohta, Michio Kuniya, Koji Fukumoto (Renesas Technology)

(18) 11:20 - 11:45
Improvement of layout analysis by connecting emission/OBIRCH analysis with CAD data
Akira Shimase, Akihito Uchikado, Mitsuaki Saeki, Shinichi Watarai, Takeshi Suzuki, Toshiyuki Majima (Renesas), Kazuhiro Hotta, Hirotoshi Terada (HPK)

(19) 11:45 - 12:10
SoC macro-block diagnosis using extracted layout information
Katsuyoshi Miura, Koji Nakamae (Osaka Univ.)

----- Lunch Break ( 50 min. ) -----

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Fri, Jan 19 PM (13:00 - 14:15)
----------------------------------------

(20) 13:00 - 13:25
A Constrained Test Generation Method for Low Power Testing
Yoshiaki Tounoue, Xiaoqing Wen, Seiji Kajihara (K I T), Kohei Miyase (JST), Tatsuya Suzuki, Yuta Yamato (K I T)

(21) 13:25 - 13:50
A Note on 100x Test Data Compression for Scan-Based BIST
Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki (Tokyo Metro. Univ.), Tatsuru Matsuo, Takahisa Hiraide (Fujitsu Lab.), Hideaki Konishi, Michiaki Emori, Takashi Aikyo (Fujitsu)

(22) 13:50 - 14:15
Investigation on estimation methods of faulty parameters for analog circuits
Norio Kuji (Hachinohe National C. T.)

----- Break ( 15 min. ) -----

----------------------------------------
Fri, Jan 19 PM (14:30 - 16:35)
----------------------------------------

(23) 14:30 - 15:20
[Special Invited Talk]
Integrated RF MEMS and Its Packaging Technology
Kei Kuwabara, Norio Sato (NTT), Katsuyuki Machida (NTT-AT), Hiromu Ishii, Munenari Kawashima, Yo Yamaguchi, Kazuhiro Uehara (NTT)

(24) 15:20 - 15:45
Effects of the Board Power/Ground Layer Configuration on Simultaneous Switching Noise(SSN)and EMI
Takanobu Kushihira (MSC), Toshio Sudo (Toshiba)

(25) 15:45 - 16:10
Wid eband Decoupling Properties by the Combination of Ultra-thin Insulator and EBG Structure
Seiju Ichijo (Toshiba), Takanobu Kushihira (MSC), Toshio Sudo (Toshiba)

(26) 16:10 - 16:35
EMI Reducing Techniques for Low Voltage Differential Signaling by applying a Vertically Differential Method and Data arrangement optimization
Ayako Takagi, Masahiro Baba, Haruhiko Okumura (Toshiba Corp. R&D Ctr.)

# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.
Invited Talk will have 40 minutes for presentation and 10 minutes for discussion.


=== Technical Committee on Component Parts and Materials (CPM) ===
# FUTURE SCHEDULE:

Fri, Mar 2, 2007: Kikai-Shinko-Kaikan Bldg [Wed, Jan 10]
Fri, Apr 20, 2007: Kikai-Shinko-Kaikan Bldg. [Fri, Feb 16]

# SECRETARY:
Tohru Matsuura (ATR)
TEL 0774-95-1173, FAX 0774-95-1178
E-mail: tohrum@atr.jp

Seiji Toyoda(NTT)
TEL 0422-59-7365, FAX 0422-59-5575
E-mail: toyoda.seiji@lab.ntt.co.jp

Hidehiko Shimizu(Niigata University)
TEL 025-262-6811, FAX 025-262-6811
E-mail: shimizu@eng.niigata-u.ac.jp

Yasushi Takemura(Yokohama National University)
TEL 045-339-4151, FAX 045-339-4151
E-mail: takemura@ynu.ac.jp

Hiroshi Yamada (Toshiba)
TEL 044-549-2141, FAX 045-520-1501
E-mail: hiroshi.yamada@toshiba.co.jp

=== Technical Committee on Integrated Circuits and Devices (ICD) ===
# FUTURE SCHEDULE:

Wed, Mar 7, 2007 - Fri, Mar 9, 2007: Mielparque Okinawa [Wed, Dec 13], Topics: System-on-silicon design techniques and related VLSs

# SECRETARY:
Makoto Nagata (Kobe University)
TEL 078-803-6569,FAX 078-803-6221
E-mail:nagata@cs.kobe-u.ac.jp

Toshimasa Matsuoka (Osaka University)
TEL 06-6879-7792,FAX 06-6879-7792
E-mail:nagata@cs.kobe-u.ac.jp


Last modified: 2007-02-26 21:57:43


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