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Paper Abstract and Keywords
Presentation 2022-07-19 17:05
Security Evaluation of Cryptographic Circuits with Laser Sensors by Double-Spot Laser Irradiation
Masaki Chikano, Naoki Yoshida, Junichi Sakamoto, Syungo Hayashi, Tsutomu Matsumoto (YNU) ISEC2022-16 SITE2022-20 BioX2022-41 HWS2022-16 ICSS2022-24 EMM2022-24
Abstract (in Japanese) (See Japanese page) 
(in English) A fault injection attack is an attack method that intentionally injects faults into a device to cause it to malfunction, and then attempts to observe the malfunction and analyze the internal confidential information. Attacks using laser irradiation, which enables precise fault injection, are particularly powerful, and development of countermeasures against them is required. In this article, we report the results of security evaluation by double-spot laser irradiation against an FPGA-implemented cryptographic circuit including a full-digital laser detection circuit proposed in a previous study, which is said to withstand a single laser irradiation attack.
Keyword (in Japanese) (See Japanese page) 
(in English) Implementation Attack / Fault Injection Attack / Laser / Laser Detection / Security / FPGA / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 125, HWS2022-16, pp. 52-57, July 2022.
Paper # HWS2022-16 
Date of Issue 2022-07-12 (ISEC, SITE, BioX, HWS, ICSS, EMM) 
ISSN Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ISEC2022-16 SITE2022-20 BioX2022-41 HWS2022-16 ICSS2022-24 EMM2022-24

Conference Information
Committee EMM BioX ISEC SITE ICSS HWS IPSJ-CSEC IPSJ-SPT 
Conference Date 2022-07-19 - 2022-07-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To HWS 
Conference Code 2022-07-EMM-BioX-ISEC-SITE-ICSS-HWS-CSEC-SPT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Security Evaluation of Cryptographic Circuits with Laser Sensors by Double-Spot Laser Irradiation 
Sub Title (in English)  
Keyword(1) Implementation Attack  
Keyword(2) Fault Injection Attack  
Keyword(3) Laser  
Keyword(4) Laser Detection  
Keyword(5) Security  
Keyword(6) FPGA  
Keyword(7)  
Keyword(8)  
1st Author's Name Masaki Chikano  
1st Author's Affiliation Yokohama National University (YNU)
2nd Author's Name Naoki Yoshida  
2nd Author's Affiliation Yokohama National University (YNU)
3rd Author's Name Junichi Sakamoto  
3rd Author's Affiliation Yokohama National University (YNU)
4th Author's Name Syungo Hayashi  
4th Author's Affiliation Yokohama National University (YNU)
5th Author's Name Tsutomu Matsumoto  
5th Author's Affiliation Yokohama National University (YNU)
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Speaker Author-1 
Date Time 2022-07-19 17:05:00 
Presentation Time 25 minutes 
Registration for HWS 
Paper # ISEC2022-16, SITE2022-20, BioX2022-41, HWS2022-16, ICSS2022-24, EMM2022-24 
Volume (vol) vol.122 
Number (no) no.122(ISEC), no.123(SITE), no.124(BioX), no.125(HWS), no.126(ICSS), no.127(EMM) 
Page pp.52-57 
#Pages
Date of Issue 2022-07-12 (ISEC, SITE, BioX, HWS, ICSS, EMM) 


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