Paper Abstract and Keywords |
Presentation |
2022-07-19 11:10
Time resolved measurement of transient impedance in thin film devices by extended and light synchronized time domain reflectometry Masatoshi Sakai, Satoshi Kaino, Tomoaki Mashiko, Sou Kuromasa, Koki Takano, Shintaro Fujii, Kazuhiro Kudo (Chiba Univ.) OME2022-22 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
It takes nanoseconds to milliseconds for an electronic device to arrive at one’s steady state from the beginning of the voltage application, so we usually do not perceive this time. However, observation of the transient state during the device rising time is crucial in the frontline of the novel device development because they have to know where is the bottleneck of the present device structure. We have proposed our extended time domain reflectometry (ExTDR) to observe the transient impedance and reveal the carrier dynamics of the electronic devices. Time-domain reflectometry (TDR) was an instantaneous impedance detection method that was used in disconnection detection of long-distance communication cable or soil surveys. In this work, we extended conventional TDR and adopted it to detect the transient impedance of thin-film devices. We have indicated the carrier dynamics in OTFT and OLED. Moreover, we recently developed light synchronized TDR to observe the initial photo-carrier generation process in OPV. We introduce the principle of ExTDR and Light synchronized TDR measurement and examples of carrier dynamics of the OTFT, OLED, and OPV from 10 ns to 10 ms time region. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
OTFT / OLED / OPV / time-resolved / impedance / / / |
Reference Info. |
IEICE Tech. Rep., vol. 122, no. 116, OME2022-22, pp. 42-45, July 2022. |
Paper # |
OME2022-22 |
Date of Issue |
2022-07-11 (OME) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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OME2022-22 |
Conference Information |
Committee |
OME IEE-DEI |
Conference Date |
2022-07-18 - 2022-07-19 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Karuizawa-machi Tourism promotion center |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Organic film, Organic-Bio devices, etc. |
Paper Information |
Registration To |
OME |
Conference Code |
2022-07-OME-DEI |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Time resolved measurement of transient impedance in thin film devices by extended and light synchronized time domain reflectometry |
Sub Title (in English) |
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Keyword(1) |
OTFT |
Keyword(2) |
OLED |
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OPV |
Keyword(4) |
time-resolved |
Keyword(5) |
impedance |
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1st Author's Name |
Masatoshi Sakai |
1st Author's Affiliation |
Chiba University (Chiba Univ.) |
2nd Author's Name |
Satoshi Kaino |
2nd Author's Affiliation |
Chiba University (Chiba Univ.) |
3rd Author's Name |
Tomoaki Mashiko |
3rd Author's Affiliation |
Chiba University (Chiba Univ.) |
4th Author's Name |
Sou Kuromasa |
4th Author's Affiliation |
Chiba University (Chiba Univ.) |
5th Author's Name |
Koki Takano |
5th Author's Affiliation |
Chiba University (Chiba Univ.) |
6th Author's Name |
Shintaro Fujii |
6th Author's Affiliation |
Chiba University (Chiba Univ.) |
7th Author's Name |
Kazuhiro Kudo |
7th Author's Affiliation |
Chiba University (Chiba Univ.) |
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Speaker |
Author-1 |
Date Time |
2022-07-19 11:10:00 |
Presentation Time |
25 minutes |
Registration for |
OME |
Paper # |
OME2022-22 |
Volume (vol) |
vol.122 |
Number (no) |
no.116 |
Page |
pp.42-45 |
#Pages |
4 |
Date of Issue |
2022-07-11 (OME) |
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