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Paper Abstract and Keywords
Presentation 2022-07-19 11:10
Time resolved measurement of transient impedance in thin film devices by extended and light synchronized time domain reflectometry
Masatoshi Sakai, Satoshi Kaino, Tomoaki Mashiko, Sou Kuromasa, Koki Takano, Shintaro Fujii, Kazuhiro Kudo (Chiba Univ.) OME2022-22
Abstract (in Japanese) (See Japanese page) 
(in English) It takes nanoseconds to milliseconds for an electronic device to arrive at one’s steady state from the beginning of the voltage application, so we usually do not perceive this time. However, observation of the transient state during the device rising time is crucial in the frontline of the novel device development because they have to know where is the bottleneck of the present device structure. We have proposed our extended time domain reflectometry (ExTDR) to observe the transient impedance and reveal the carrier dynamics of the electronic devices. Time-domain reflectometry (TDR) was an instantaneous impedance detection method that was used in disconnection detection of long-distance communication cable or soil surveys. In this work, we extended conventional TDR and adopted it to detect the transient impedance of thin-film devices. We have indicated the carrier dynamics in OTFT and OLED. Moreover, we recently developed light synchronized TDR to observe the initial photo-carrier generation process in OPV. We introduce the principle of ExTDR and Light synchronized TDR measurement and examples of carrier dynamics of the OTFT, OLED, and OPV from 10 ns to 10 ms time region.
Keyword (in Japanese) (See Japanese page) 
(in English) OTFT / OLED / OPV / time-resolved / impedance / / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 116, OME2022-22, pp. 42-45, July 2022.
Paper # OME2022-22 
Date of Issue 2022-07-11 (OME) 
ISSN Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee OME IEE-DEI  
Conference Date 2022-07-18 - 2022-07-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Karuizawa-machi Tourism promotion center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Organic film, Organic-Bio devices, etc. 
Paper Information
Registration To OME 
Conference Code 2022-07-OME-DEI 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Time resolved measurement of transient impedance in thin film devices by extended and light synchronized time domain reflectometry 
Sub Title (in English)  
Keyword(1) OTFT  
Keyword(2) OLED  
Keyword(3) OPV  
Keyword(4) time-resolved  
Keyword(5) impedance  
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1st Author's Name Masatoshi Sakai  
1st Author's Affiliation Chiba University (Chiba Univ.)
2nd Author's Name Satoshi Kaino  
2nd Author's Affiliation Chiba University (Chiba Univ.)
3rd Author's Name Tomoaki Mashiko  
3rd Author's Affiliation Chiba University (Chiba Univ.)
4th Author's Name Sou Kuromasa  
4th Author's Affiliation Chiba University (Chiba Univ.)
5th Author's Name Koki Takano  
5th Author's Affiliation Chiba University (Chiba Univ.)
6th Author's Name Shintaro Fujii  
6th Author's Affiliation Chiba University (Chiba Univ.)
7th Author's Name Kazuhiro Kudo  
7th Author's Affiliation Chiba University (Chiba Univ.)
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Speaker Author-1 
Date Time 2022-07-19 11:10:00 
Presentation Time 25 minutes 
Registration for OME 
Paper # OME2022-22 
Volume (vol) vol.122 
Number (no) no.116 
Page pp.42-45 
#Pages
Date of Issue 2022-07-11 (OME) 


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