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| Presentation | 2022-04-26 13:30 Fundamental Study on ID Generation Method Focusing on Distribution of Capacitance Sensor Output Values Shugo Kaji, Ayaki Tachikake, Daisuke Fujimoto, Yuichi Hayashi (NAIST)  HWS2022-4 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | An individual identification using a capacitance sensor configured with a constant current source and an A/D converter inside the IC shows the possibility of guaranteeing authenticity at the PCB level without external measurement equipment. However, the individual identification method had been evaluated only using correlation values of the output's histograms; the ID generation method and identification performance have not been investigated. This paper presents a method of individual identification by generating IDs using the distribution of capacitance sensor output values. Specifically, feature points are extracted from the histogram generated from the capacitance sensor output values, and ID is generated by selecting bits with high repeatability and uniqueness. Then, identify individuals by calculating the Hamming distance between the pre-stored IDs and the ID generated from the anonymous device. We used 20 microcomputer boards in the experiment, and the result showed that individual identification could be achieved with 97.14 % accuracy. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Device identification / Process variation / / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 122, no. 11, HWS2022-4, pp. 19-23, April 2022. | |
| Paper # | HWS2022-4 | |
| Date of Issue | 2022-04-19 (HWS) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | HWS2022-4 |
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| Conference Information | |
| Committee | HWS |
| Conference Date | 2022-04-26 - 2022-04-26 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | AIST Tokyo Waterfront (Annex) |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Hardware Security, etc. |
| Paper Information | |
| Registration To | HWS |
| Conference Code | 2022-04-HWS |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Fundamental Study on ID Generation Method Focusing on Distribution of Capacitance Sensor Output Values |
| Sub Title (in English) | |
| Keyword(1) | Device identification |
| Keyword(2) | Process variation |
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| 1st Author's Name | Shugo Kaji |
| 1st Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 2nd Author's Name | Ayaki Tachikake |
| 2nd Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 3rd Author's Name | Daisuke Fujimoto |
| 3rd Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 4th Author's Name | Yuichi Hayashi |
| 4th Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
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| Speaker | Author-1 |
| Date Time | 2022-04-26 13:30:00 |
| Presentation Time | 25 minutes |
| Registration for | HWS |
| Paper # | HWS2022-4 |
| Volume (vol) | vol.122 |
| Number (no) | no.11 |
| Page | pp.19-23 |
| #Pages | 5 |
| Date of Issue | 2022-04-19 (HWS) |
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