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Paper Abstract and Keywords
Presentation 2022-04-15 13:30
Impact of Different Powered ESD Methods on 100BASE-T1 Communication Quality Degradation
Toya Nakatani, Yusuke Yano, Jianqing Wang (NIT), Takeshi Ishida (NoiseKen) EMCJ2022-2
Abstract (in Japanese) (See Japanese page) 
(in English) IEC (International Electrotechnical Commission) has been working on the standardization of immunity evaluation methods for Ethernet transceiver ICs in automotive equipment, and the powered ESD (Electrostatic discharge) test is required for immunity evaluation of ESD. However, there is concern about the reproducibility of the ESD-gun generated disturbance in the powered ESD test. In this study, we investigate the possibility of using TLP-HMM (Transmission line pulse-human metal model) and CR-HMM (Capacitance resistance-human metal model), that are considered to have high reproducibility of discharge, as alternatives to ESD guns. We experimentally evaluated the effects of the three different disturbance application methods on frame error rate degradation of 100BASE-T1 IC in Powered ESD test, and showed the rudimentary potential of TLP-HMM and CR-HMM as an alternative to ESD gun.
Keyword (in Japanese) (See Japanese page) 
(in English) Vehicle ethernet / 100BASE-T1 / communication quality / immunity / powered ESD test / TLP / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 4, EMCJ2022-2, pp. 7-12, April 2022.
Paper # EMCJ2022-2 
Date of Issue 2022-04-08 (EMCJ) 
ISSN Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ  
Conference Date 2022-04-15 - 2022-04-15 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) EMC 
Paper Information
Registration To EMCJ 
Conference Code 2022-04-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Impact of Different Powered ESD Methods on 100BASE-T1 Communication Quality Degradation 
Sub Title (in English)  
Keyword(1) Vehicle ethernet  
Keyword(2) 100BASE-T1  
Keyword(3) communication quality  
Keyword(4) immunity  
Keyword(5) powered ESD test  
Keyword(6) TLP  
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Keyword(8)  
1st Author's Name Toya Nakatani  
1st Author's Affiliation Nagoya Institute of Technology (NIT)
2nd Author's Name Yusuke Yano  
2nd Author's Affiliation Nagoya Institute of Technology (NIT)
3rd Author's Name Jianqing Wang  
3rd Author's Affiliation Nagoya Institute of Technology (NIT)
4th Author's Name Takeshi Ishida  
4th Author's Affiliation NOISE LABORATORY CO.LTD. (NoiseKen)
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Speaker Author-1 
Date Time 2022-04-15 13:30:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2022-2 
Volume (vol) vol.122 
Number (no) no.4 
Page pp.7-12 
#Pages
Date of Issue 2022-04-08 (EMCJ) 


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