Paper Abstract and Keywords |
Presentation |
2022-04-15 13:30
Impact of Different Powered ESD Methods on 100BASE-T1 Communication Quality Degradation Toya Nakatani, Yusuke Yano, Jianqing Wang (NIT), Takeshi Ishida (NoiseKen) EMCJ2022-2 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
IEC (International Electrotechnical Commission) has been working on the standardization of immunity evaluation methods for Ethernet transceiver ICs in automotive equipment, and the powered ESD (Electrostatic discharge) test is required for immunity evaluation of ESD. However, there is concern about the reproducibility of the ESD-gun generated disturbance in the powered ESD test. In this study, we investigate the possibility of using TLP-HMM (Transmission line pulse-human metal model) and CR-HMM (Capacitance resistance-human metal model), that are considered to have high reproducibility of discharge, as alternatives to ESD guns. We experimentally evaluated the effects of the three different disturbance application methods on frame error rate degradation of 100BASE-T1 IC in Powered ESD test, and showed the rudimentary potential of TLP-HMM and CR-HMM as an alternative to ESD gun. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Vehicle ethernet / 100BASE-T1 / communication quality / immunity / powered ESD test / TLP / / |
Reference Info. |
IEICE Tech. Rep., vol. 122, no. 4, EMCJ2022-2, pp. 7-12, April 2022. |
Paper # |
EMCJ2022-2 |
Date of Issue |
2022-04-08 (EMCJ) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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EMCJ2022-2 |
Conference Information |
Committee |
EMCJ |
Conference Date |
2022-04-15 - 2022-04-15 |
Place (in Japanese) |
(See Japanese page) |
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EMC |
Paper Information |
Registration To |
EMCJ |
Conference Code |
2022-04-EMCJ |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Impact of Different Powered ESD Methods on 100BASE-T1 Communication Quality Degradation |
Sub Title (in English) |
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Keyword(1) |
Vehicle ethernet |
Keyword(2) |
100BASE-T1 |
Keyword(3) |
communication quality |
Keyword(4) |
immunity |
Keyword(5) |
powered ESD test |
Keyword(6) |
TLP |
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1st Author's Name |
Toya Nakatani |
1st Author's Affiliation |
Nagoya Institute of Technology (NIT) |
2nd Author's Name |
Yusuke Yano |
2nd Author's Affiliation |
Nagoya Institute of Technology (NIT) |
3rd Author's Name |
Jianqing Wang |
3rd Author's Affiliation |
Nagoya Institute of Technology (NIT) |
4th Author's Name |
Takeshi Ishida |
4th Author's Affiliation |
NOISE LABORATORY CO.LTD. (NoiseKen) |
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Speaker |
Author-1 |
Date Time |
2022-04-15 13:30:00 |
Presentation Time |
25 minutes |
Registration for |
EMCJ |
Paper # |
EMCJ2022-2 |
Volume (vol) |
vol.122 |
Number (no) |
no.4 |
Page |
pp.7-12 |
#Pages |
6 |
Date of Issue |
2022-04-08 (EMCJ) |
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