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Paper Abstract and Keywords
Presentation 2022-03-04 16:55
Axial Alignment and Focus Adjustment of Lens System and Dielectric Anisotropy Measurement Method for Sheet Materials Using Parallel Millimeter-wave Beam
Ryutaro Oba, Atsuhiro Nishikata (Tokyo Tech), Masataka Midori, Hiroshi Kurihara (TDK) EMCJ2021-77
Abstract (in Japanese) (See Japanese page) 
(in English) In the case of an anisotropic dielectric material such as a printed circuit board, the dielectric constant changes with the direction of the transmission line, so it is necessary to understand the dielectric constant as a tensor in the circuit board design where the phase difference of the signal is an issue.
In this report, we studied the adjustment method of the axis alignment and focus adjustment of the measurement system in the parallel millimeter-wave beam method using dielectric lens. We confirmed that the parallel beam part is close to the perpendicularly incident plane wave.
Furthermore, we measured the transmission $S_{21}$ parameter, which changes when sheet materials is rotated around the beam axis, and thereby estimated the main value of the complex permittivity tensor.
Keyword (in Japanese) (See Japanese page) 
(in English) Parallel beam method / Dielectric permittivity anisotropy / Dielectric lens / Axis alignment / Focus adjustment / / /  
Reference Info. IEICE Tech. Rep., vol. 121, no. 403, EMCJ2021-77, pp. 21-26, March 2022.
Paper # EMCJ2021-77 
Date of Issue 2022-02-25 (EMCJ) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee MICT EMCJ  
Conference Date 2022-03-04 - 2022-03-04 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Healthcare and Medical Information Communication Technologies, EMC, etc 
Paper Information
Registration To EMCJ 
Conference Code 2022-03-MICT-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Axial Alignment and Focus Adjustment of Lens System and Dielectric Anisotropy Measurement Method for Sheet Materials Using Parallel Millimeter-wave Beam 
Sub Title (in English)  
Keyword(1) Parallel beam method  
Keyword(2) Dielectric permittivity anisotropy  
Keyword(3) Dielectric lens  
Keyword(4) Axis alignment  
Keyword(5) Focus adjustment  
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Keyword(7)  
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1st Author's Name Ryutaro Oba  
1st Author's Affiliation Tokyo Institute of Technology (Tokyo Tech)
2nd Author's Name Atsuhiro Nishikata  
2nd Author's Affiliation Tokyo Institute of Technology (Tokyo Tech)
3rd Author's Name Masataka Midori  
3rd Author's Affiliation TDK Corporation (TDK)
4th Author's Name Hiroshi Kurihara  
4th Author's Affiliation TDK Corporation (TDK)
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Speaker
Date Time 2022-03-04 16:55:00 
Presentation Time 20 
Registration for EMCJ 
Paper # IEICE-EMCJ2021-77 
Volume (vol) IEICE-121 
Number (no) no.403 
Page pp.21-26 
#Pages IEICE-6 
Date of Issue IEICE-EMCJ-2022-02-25 


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