Paper Abstract and Keywords |
Presentation |
2022-03-01 14:20
Evaluation of Efficiency for a Method to Locate High Power Consumption with Switching Provability Ryu Hoshino, Taiki Utsunomiya, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2021-73 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In recent years, as the high speed and miniaturization of LSIs have improved, it has become more difficult to test LSIs.During LSI testing, the power consumption increases due to more switching activities than in normal operation, and then excessive IR-drop occurs. When excessive IR-drop occurs, excessive delays which may lead to test malfunction even if circuits with no problems in normal operation Therefore, in order to avoid test malfunction, it is necessary to apply appropriate techniques before LSI testing is conducted. Excessive IR-drop does not occur in the entire circuit, but in areas where switching activities are densely concentrated.Therefore, in order to effectively reduce excessive IR-drops, it is important to locate areas where switching activity densely occurs.In this paper, we present the method to locate areas where many switching activities occur with switching probabilities of logic gates, and then we evaluate its effectiveness and efficiency. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
At-speed testing / test power / transition delay test / IR-drop / test malfunction / / / |
Reference Info. |
IEICE Tech. Rep., vol. 121, no. 388, DC2021-73, pp. 51-56, March 2022. |
Paper # |
DC2021-73 |
Date of Issue |
2022-02-22 (DC) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2021-73 |
Conference Information |
Committee |
DC |
Conference Date |
2022-03-01 - 2022-03-01 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
DC |
Conference Code |
2022-03-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Evaluation of Efficiency for a Method to Locate High Power Consumption with Switching Provability |
Sub Title (in English) |
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Keyword(1) |
At-speed testing |
Keyword(2) |
test power |
Keyword(3) |
transition delay test |
Keyword(4) |
IR-drop |
Keyword(5) |
test malfunction |
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1st Author's Name |
Ryu Hoshino |
1st Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
2nd Author's Name |
Taiki Utsunomiya |
2nd Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
3rd Author's Name |
Kohei Miyase |
3rd Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
4th Author's Name |
Xiaoqing Wen |
4th Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
5th Author's Name |
Seiji Kajihara |
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Kyushu Institute of Technology (Kyutech) |
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Speaker |
Author-1 |
Date Time |
2022-03-01 14:20:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2021-73 |
Volume (vol) |
vol.121 |
Number (no) |
no.388 |
Page |
pp.51-56 |
#Pages |
6 |
Date of Issue |
2022-02-22 (DC) |
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