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Paper Abstract and Keywords
Presentation 2022-01-27 11:00
Research on anomaly detection using machine learning in external images of Optical Lens
Tatsuki Ono, Takuto Ito, Tomoatsu Hasegawa, Hideaki Kimura (Chubu Univ.) EST2021-60 Link to ES Tech. Rep. Archives: EST2021-60
Abstract (in Japanese) (See Japanese page) 
(in English) Appearance inspection is an important task for maintaining quality and is performed at various places in the manufacturing process.
However, Since this process requires manpower, there is a problem that the manufacturing cost increases.
In the future, we plan to further improve the inspection accuracy and expand the number of target products by generalizing the equipment.
In this paper, PaDiMcite{PaDiM} was used after integrating and trimming the appearance image of the optical lens as preprocessing.
The results were then classified as good and defective products by using a voting process.
As a comparison of pretreatment, the effectiveness of the proposed method was confirmed by conducting a comparative experiment with the integration method and the presence or absence of trimming.
As a result, we were able to obtain a result of 81.79% in F-mesure, which is the harmonic mean of accuracy and reproducibility.
Keyword (in Japanese) (See Japanese page) 
(in English) Image Processing / Anomaly detection / Machine learning / / / / /  
Reference Info. IEICE Tech. Rep., vol. 121, no. 358, EST2021-60, pp. 19-22, Jan. 2022.
Paper # EST2021-60 
Date of Issue 2022-01-20 (EST) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EST2021-60 Link to ES Tech. Rep. Archives: EST2021-60

Conference Information
Committee EST  
Conference Date 2022-01-27 - 2022-01-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Simulation techniques, etc. 
Paper Information
Registration To EST 
Conference Code 2022-01-EST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Research on anomaly detection using machine learning in external images of Optical Lens 
Sub Title (in English)  
Keyword(1) Image Processing  
Keyword(2) Anomaly detection  
Keyword(3) Machine learning  
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1st Author's Name Tatsuki Ono  
1st Author's Affiliation Chubu University (Chubu Univ.)
2nd Author's Name Takuto Ito  
2nd Author's Affiliation Chubu University (Chubu Univ.)
3rd Author's Name Tomoatsu Hasegawa  
3rd Author's Affiliation Chubu University (Chubu Univ.)
4th Author's Name Hideaki Kimura  
4th Author's Affiliation Chubu University (Chubu Univ.)
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Speaker Author-1 
Date Time 2022-01-27 11:00:00 
Presentation Time 20 minutes 
Registration for EST 
Paper # EST2021-60 
Volume (vol) vol.121 
Number (no) no.358 
Page pp.19-22 
#Pages
Date of Issue 2022-01-20 (EST) 


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