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Paper Abstract and Keywords
Presentation 2021-12-10 13:00
A Low Power Oriented Multiple Target Test Generation Method
Rei Miura, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.), Masayuki Arai (Nihon Univ.) DC2021-55
Abstract (in Japanese) (See Japanese page) 
(in English) In recent years, since capture power consumption for VLSIs significantly increases in at-speed scan testing, low capture power-oriented test generation methods have been proposed. In the conventional method, a test set is generated using automatic test pattern generators, don't care (X) identification is performed for only capture-safe test vectors in the test set whose capture power consumption is less than or equal to the threshold values. X-filling is performed for capture-safe test cubes in order to detect unsafe faults which are detected only by capture-unsafe test vectors. The numbers of capture-unsafe test vectors and unsafe faults were reduced by the X-filling method. However, in the conventional method, since the number of unsafe faults detected by the X-filling depends on the care bit locations of capture-safe test cubes, the number of unsafe faults might not be efficiently reduced. Therefore, the numbers of capture-safe test vectors might be larger than those of the initial test set. In this paper, to generate a small capture-safe test set, we propose a pseudo-Boolean optimization based low capture power oriented multiple target fault test generation method using the information of simultaneously detectable safe faults by capture-safe test cubes in the initial test set. The experimental results show that our proposed method could reduce the number of capture-unsafe test vectors by 100% and reduce the number of unsafe faults by 98% on the average compared to the initial test set with low power consideration.
Keyword (in Japanese) (See Japanese page) 
(in English) multiple target test generation / capture safe test vector / unsafe fault / PBO / / / /  
Reference Info. IEICE Tech. Rep., vol. 121, no. 293, DC2021-55, pp. 1-6, Dec. 2021.
Paper # DC2021-55 
Date of Issue 2021-12-03 (DC) 
ISSN Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2021-12-10 - 2021-12-10 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
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Paper Information
Registration To DC 
Conference Code 2021-12-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Low Power Oriented Multiple Target Test Generation Method 
Sub Title (in English)  
Keyword(1) multiple target test generation  
Keyword(2) capture safe test vector  
Keyword(3) unsafe fault  
Keyword(4) PBO  
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1st Author's Name Rei Miura  
1st Author's Affiliation Nihon University (Nihon Univ.)
2nd Author's Name Toshinori Hosokawa  
2nd Author's Affiliation Nihon University (Nihon Univ.)
3rd Author's Name Hiroshi Yamazaki  
3rd Author's Affiliation Nihon University (Nihon Univ.)
4th Author's Name Masayoshi Yoshimura  
4th Author's Affiliation Kyoto Sangyou University (Kyoto Sangyou Univ.)
5th Author's Name Masayuki Arai  
5th Author's Affiliation Nihon University (Nihon Univ.)
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Speaker Author-1 
Date Time 2021-12-10 13:00:00 
Presentation Time 20 minutes 
Registration for DC 
Paper # DC2021-55 
Volume (vol) vol.121 
Number (no) no.293 
Page pp.1-6 
#Pages
Date of Issue 2021-12-03 (DC) 


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