Paper Abstract and Keywords |
Presentation |
2021-12-10 13:00
A Low Power Oriented Multiple Target Test Generation Method Rei Miura, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.), Masayuki Arai (Nihon Univ.) DC2021-55 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In recent years, since capture power consumption for VLSIs significantly increases in at-speed scan testing, low capture power-oriented test generation methods have been proposed. In the conventional method, a test set is generated using automatic test pattern generators, don't care (X) identification is performed for only capture-safe test vectors in the test set whose capture power consumption is less than or equal to the threshold values. X-filling is performed for capture-safe test cubes in order to detect unsafe faults which are detected only by capture-unsafe test vectors. The numbers of capture-unsafe test vectors and unsafe faults were reduced by the X-filling method. However, in the conventional method, since the number of unsafe faults detected by the X-filling depends on the care bit locations of capture-safe test cubes, the number of unsafe faults might not be efficiently reduced. Therefore, the numbers of capture-safe test vectors might be larger than those of the initial test set. In this paper, to generate a small capture-safe test set, we propose a pseudo-Boolean optimization based low capture power oriented multiple target fault test generation method using the information of simultaneously detectable safe faults by capture-safe test cubes in the initial test set. The experimental results show that our proposed method could reduce the number of capture-unsafe test vectors by 100% and reduce the number of unsafe faults by 98% on the average compared to the initial test set with low power consideration. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
multiple target test generation / capture safe test vector / unsafe fault / PBO / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 121, no. 293, DC2021-55, pp. 1-6, Dec. 2021. |
Paper # |
DC2021-55 |
Date of Issue |
2021-12-03 (DC) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2021-55 |
Conference Information |
Committee |
DC |
Conference Date |
2021-12-10 - 2021-12-10 |
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(See Japanese page) |
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Paper Information |
Registration To |
DC |
Conference Code |
2021-12-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A Low Power Oriented Multiple Target Test Generation Method |
Sub Title (in English) |
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Keyword(1) |
multiple target test generation |
Keyword(2) |
capture safe test vector |
Keyword(3) |
unsafe fault |
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PBO |
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1st Author's Name |
Rei Miura |
1st Author's Affiliation |
Nihon University (Nihon Univ.) |
2nd Author's Name |
Toshinori Hosokawa |
2nd Author's Affiliation |
Nihon University (Nihon Univ.) |
3rd Author's Name |
Hiroshi Yamazaki |
3rd Author's Affiliation |
Nihon University (Nihon Univ.) |
4th Author's Name |
Masayoshi Yoshimura |
4th Author's Affiliation |
Kyoto Sangyou University (Kyoto Sangyou Univ.) |
5th Author's Name |
Masayuki Arai |
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Nihon University (Nihon Univ.) |
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Speaker |
Author-1 |
Date Time |
2021-12-10 13:00:00 |
Presentation Time |
20 minutes |
Registration for |
DC |
Paper # |
DC2021-55 |
Volume (vol) |
vol.121 |
Number (no) |
no.293 |
Page |
pp.1-6 |
#Pages |
6 |
Date of Issue |
2021-12-03 (DC) |
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