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Paper Abstract and Keywords
Presentation 2021-11-30 14:25
Queueing simulation of faults correction based on software reliability growth models
Yuka Minamino (Tottori Univ.), Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.) R2021-37
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
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Reference Info. IEICE Tech. Rep., vol. 121, no. 276, R2021-37, pp. 19-23, Nov. 2021.
Paper # R2021-37 
Date of Issue 2021-11-23 (R) 
ISSN Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee R  
Conference Date 2021-11-30 - 2021-11-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability of semiconductor and electronic devices, Reliability ge 
Paper Information
Registration To R 
Conference Code 2021-11-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Queueing simulation of faults correction based on software reliability growth models 
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1st Author's Name Yuka Minamino  
1st Author's Affiliation Tottori University (Tottori Univ.)
2nd Author's Name Shinji Inoue  
2nd Author's Affiliation Kansai University (Kansai Univ.)
3rd Author's Name Shigeru Yamada  
3rd Author's Affiliation Tottori University (Tottori Univ.)
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Date Time 2021-11-30 14:25:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2021-37 
Volume (vol) vol.121 
Number (no) no.276 
Page pp.19-23 
#Pages
Date of Issue 2021-11-23 (R) 


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