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| Presentation | 2021-11-30 14:50 Safety Analysis for Safety-Related Software Based on a Fault Detection Count Model Shinji Inoue (Kansai Univ.), Takaji Fujiwara (SRATECH Lab.), Shigeru Yamada (Tottori Univ.)  R2021-38 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | IEC 61508 is widely known as the international standard for the functional safety of electrical/electronic/programmable electronic (E/E/PE) safety-related systems. Especially for the hardware of E/E/PE safety-related systems, IEC 61508 requires to assess their safety based on the safety integrity level (SIL) measured by the target failure measures. However, IEC 61508 does not give us the methodologies on quantitative safety assessment for the E/E/PE safety-related system software because the software failure is treated as a systematic failure. We discuss approximated methods for estimating target failure measures, which are basic measures for allocating SIL, for SIL-based software safety assessment by applying the technical notions of software fault detection count model in software reliability assessment technologies. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Functional safety / E/E/PE safety-related systems / IEC 61508 / safety integrity level / software reliability model / fault detection model / / | |
| Reference Info. | IEICE Tech. Rep., vol. 121, no. 276, R2021-38, pp. 24-29, Nov. 2021. | |
| Paper # | R2021-38 | |
| Date of Issue | 2021-11-23 (R) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | R2021-38 |
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| Conference Information | |
| Committee | R |
| Conference Date | 2021-11-30 - 2021-11-30 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Reliability of semiconductor and electronic devices, Reliability ge |
| Paper Information | |
| Registration To | R |
| Conference Code | 2021-11-R |
| Language | English (Japanese title is available) |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Safety Analysis for Safety-Related Software Based on a Fault Detection Count Model |
| Sub Title (in English) | |
| Keyword(1) | Functional safety |
| Keyword(2) | E/E/PE safety-related systems |
| Keyword(3) | IEC 61508 |
| Keyword(4) | safety integrity level |
| Keyword(5) | software reliability model |
| Keyword(6) | fault detection model |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Shinji Inoue |
| 1st Author's Affiliation | Kansai University (Kansai Univ.) |
| 2nd Author's Name | Takaji Fujiwara |
| 2nd Author's Affiliation | SRATECH Lab. Inc. (SRATECH Lab.) |
| 3rd Author's Name | Shigeru Yamada |
| 3rd Author's Affiliation | Tottori University (Tottori Univ.) |
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| Speaker | Author-1 |
| Date Time | 2021-11-30 14:50:00 |
| Presentation Time | 25 minutes |
| Registration for | R |
| Paper # | R2021-38 |
| Volume (vol) | vol.121 |
| Number (no) | no.276 |
| Page | pp.24-29 |
| #Pages | 6 |
| Date of Issue | 2021-11-23 (R) |
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