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| Presentation | 2021-05-27 13:00 [Invited Talk] Thermoelectric properties of Si nanostructures and their characterization techniques Hiroya Ikeda (Shizuoka Univ.)  ED2021-1 CPM2021-1 SDM2021-12 Link to ES Tech. Rep. Archives: ED2021-1 CPM2021-1 SDM2021-12 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The enhancement of the thermoelectric performance has been expected by Si nanostrucutres. The Si Seebeck coefficient is strongly dependent upon the influence of phonon drag, which, however, is not sufficiently understood yet. In the present report, we discussed on the contribution of phonon drag to the Seebeck coefficient in ultrathin Si-on-insulator (SOI) layers and Si microribbon structures from the viewpoint of phonon transport, based on the experimental results of the Seebeck coefficient. In addition, with the aim of measuring the Seebeck coefficient of nanometer-scale materials, we have developed a novel technique using Kelvin-probe force microscopy (KFM) and demonstrate the evaluation of Seebeck coefficient of ultrathin SOI.A novel thermal-diffusivity evaluation by scanning electron microscopy (SEM) together with infrared (IR) thermography is also demonstrated to be applicable for nanowire materials. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Seebeck coefficient / phonon drag / Kelvin-probe force microscopy / thermal diffusivity / AC calorimetory / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 121, no. 46, SDM2021-12, pp. 1-6, May 2021. | |
| Paper # | SDM2021-12 | |
| Date of Issue | 2021-05-20 (ED, CPM, SDM) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ED2021-1 CPM2021-1 SDM2021-12 Link to ES Tech. Rep. Archives: ED2021-1 CPM2021-1 SDM2021-12 |
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| Conference Information | |
| Committee | ED SDM CPM |
| Conference Date | 2021-05-27 - 2021-05-27 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | SDM |
| Conference Code | 2021-05-ED-SDM-CPM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Thermoelectric properties of Si nanostructures and their characterization techniques |
| Sub Title (in English) | |
| Keyword(1) | Seebeck coefficient |
| Keyword(2) | phonon drag |
| Keyword(3) | Kelvin-probe force microscopy |
| Keyword(4) | thermal diffusivity |
| Keyword(5) | AC calorimetory |
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| 1st Author's Name | Hiroya Ikeda |
| 1st Author's Affiliation | Shizuoka University (Shizuoka Univ.) |
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| Speaker | Author-1 |
| Date Time | 2021-05-27 13:00:00 |
| Presentation Time | 45 minutes |
| Registration for | SDM |
| Paper # | ED2021-1, CPM2021-1, SDM2021-12 |
| Volume (vol) | vol.121 |
| Number (no) | no.44(ED), no.45(CPM), no.46(SDM) |
| Page | pp.1-6 |
| #Pages | 6 |
| Date of Issue | 2021-05-20 (ED, CPM, SDM) |
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