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Paper Abstract and Keywords
Presentation 2021-03-26 11:40
A Controller Augmentation method to Improving Transition Fault Coverage
Kyohei Iizuka, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyoto Sangyo Univ) CPSY2020-63 DC2020-93
Abstract (in Japanese) (See Japanese page) 
(in English) With shrinking feature sizes, growing clock frequencies, and decreasing power supply voltage, modern VLSIs are increasingly suffering from the impact of timing related defects. Therefore, transition fault testing is necessary. However, test generation for transition faults generally identifies many untestable faults due to the circuit structures and functions of VLSIs. When a target fault is untestable, a test that would have covered its site is missing from the test set. As a result, the test set might not detect defects around this site, even if the defects are detectable. Therefore, design-for-testability to improve transition fault coverage is very important. QDT value were proposed as testability measure of transition fault testing for state assignments of controllers. This paper proposes a method to insert additional state transitions into controllers using extended QDT value to increase the number of sensitizable paths between state registers. Experimental results for the MCNC'91 benchmark circuits show that transition fault coverage for controllers was improved by applying our proposed method.
Keyword (in Japanese) (See Japanese page) 
(in English) transition faults / controller augmentation / QDT value / state transitions / / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 436, DC2020-93, pp. 79-84, March 2021.
Paper # DC2020-93 
Date of Issue 2021-03-18 (CPSY, DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPSY2020-63 DC2020-93

Conference Information
Conference Date 2021-03-25 - 2021-03-26 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) ETNET2021 
Paper Information
Registration To DC 
Conference Code 2021-03-CPSY-DC-SLDM-EMB-ARC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Controller Augmentation method to Improving Transition Fault Coverage 
Sub Title (in English)  
Keyword(1) transition faults  
Keyword(2) controller augmentation  
Keyword(3) QDT value  
Keyword(4) state transitions  
1st Author's Name Kyohei Iizuka  
1st Author's Affiliation Nihon University (Nihon Univ)
2nd Author's Name Toshinori Hosokawa  
2nd Author's Affiliation Nihon University (Nihon Univ)
3rd Author's Name Hiroshi Yamazaki  
3rd Author's Affiliation Nihon University (Nihon Univ)
4th Author's Name Masayoshi Yoshimura  
4th Author's Affiliation Kyoto Sangyo University (Kyoto Sangyo Univ)
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Date Time 2021-03-26 11:40:00 
Presentation Time 20 
Registration for DC 
Paper # IEICE-CPSY2020-63,IEICE-DC2020-93 
Volume (vol) IEICE-120 
Number (no) no.435(CPSY), no.436(DC) 
Page pp.79-84 
#Pages IEICE-6 
Date of Issue IEICE-CPSY-2021-03-18,IEICE-DC-2021-03-18 

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