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| Presentation | 2021-03-18 09:25 [Encouragement Talk] An Automation Technology of Testing Environment Configuration for ICT System Products by Search-based System Design Generation Scheme Kazuki Tanabe, Takayuki Kuroda, Kozo Satoda (NEC)  ICM2020-60 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In this paper, we propose an automation technology to generate comprehensive testing environments for performance evaluation of ICT system component products e.g. applications and NW equipments. In general testing phase of product development, comprehensive performance tests have to be conducted on various testing environments for verifying products’ functional and non-functional requirements. Conventional performance tests require manual requirement definition, designing and deployment for each variation of testing environment (testing pattern), which puts heavy burden for engineers. Our proposed architecture accepts product data as an input, which consists of two types of parameters: parameters to determine testing pattern (testing axis) and performance parameters to be measured (testing criterion). Our architecture generates abstract testing environments (testing requirements) by referring to templates of testing environments (testing template). Finally, our search-based system design generation scheme automatically generates and deploys the testing environments, by refining abstract parts of testing requirements. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | ICT system design generation / product evaluation / / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 120, no. 433, ICM2020-60, pp. 7-12, March 2021. | |
| Paper # | ICM2020-60 | |
| Date of Issue | 2021-03-11 (ICM) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ICM2020-60 |
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| Conference Information | |
| Committee | ICM |
| Conference Date | 2021-03-18 - 2021-03-19 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | ICM |
| Conference Code | 2021-03-ICM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An Automation Technology of Testing Environment Configuration for ICT System Products by Search-based System Design Generation Scheme |
| Sub Title (in English) | |
| Keyword(1) | ICT system design generation |
| Keyword(2) | product evaluation |
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| 1st Author's Name | Kazuki Tanabe |
| 1st Author's Affiliation | NEC Corporation (NEC) |
| 2nd Author's Name | Takayuki Kuroda |
| 2nd Author's Affiliation | NEC Corporation (NEC) |
| 3rd Author's Name | Kozo Satoda |
| 3rd Author's Affiliation | NEC Corporation (NEC) |
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| Speaker | Author-1 |
| Date Time | 2021-03-18 09:25:00 |
| Presentation Time | 25 minutes |
| Registration for | ICM |
| Paper # | ICM2020-60 |
| Volume (vol) | vol.120 |
| Number (no) | no.433 |
| Page | pp.7-12 |
| #Pages | 6 |
| Date of Issue | 2021-03-11 (ICM) |
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