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| Presentation | 2021-03-08 14:20 Continuous open and close test of contact resistance of electromagnetic contactor Yoshihiro Sudo, Kohei Chiba, Koichiro Sawa, Kiyoshi Yoshida (NIT)  EMD2020-32 Link to ES Tech. Rep. Archives: EMD2020-32 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In this study, the contact resistance when a small current was applied at DC5V, was automatically measured. In the experiment, the effect of the current value on the contact resistance was investigated. The current was set to 3-100mA. The continuous opening / closing test was performed up to 100,000 times. The measurement error of the assumed system was within ± 5%. In the experiment, two single contacts for the main circuit and two twin contacts for the auxiliary contacts were measured at the same time. The fluctuation of the contact resistance of the twin contacts was small and stable. On the other hand, the contact resistance of the single contact was significantly unstable at 10mA or less. At 50mA and above, the resistance value was small and stable. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | LabVIEW / Electrical Contact / Electromagnetic Contactor / Single Contact / Twin Contact / Contact Resistance / / | |
| Reference Info. | IEICE Tech. Rep., vol. 120, no. 425, EMD2020-32, pp. 18-22, March 2021. | |
| Paper # | EMD2020-32 | |
| Date of Issue | 2021-03-01 (EMD) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMD2020-32 Link to ES Tech. Rep. Archives: EMD2020-32 |
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| Conference Information | |
| Committee | EMD |
| Conference Date | 2021-03-08 - 2021-03-08 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Short NOTE |
| Paper Information | |
| Registration To | EMD |
| Conference Code | 2021-03-EMD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Continuous open and close test of contact resistance of electromagnetic contactor |
| Sub Title (in English) | |
| Keyword(1) | LabVIEW |
| Keyword(2) | Electrical Contact |
| Keyword(3) | Electromagnetic Contactor |
| Keyword(4) | Single Contact |
| Keyword(5) | Twin Contact |
| Keyword(6) | Contact Resistance |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Yoshihiro Sudo |
| 1st Author's Affiliation | Nippon Institute of Technology (NIT) |
| 2nd Author's Name | Kohei Chiba |
| 2nd Author's Affiliation | Nippon Institute of Technology (NIT) |
| 3rd Author's Name | Koichiro Sawa |
| 3rd Author's Affiliation | Nippon Institute of Technology (NIT) |
| 4th Author's Name | Kiyoshi Yoshida |
| 4th Author's Affiliation | Nippon Institute of Technology (NIT) |
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| Speaker | Author-1 |
| Date Time | 2021-03-08 14:20:00 |
| Presentation Time | 20 minutes |
| Registration for | EMD |
| Paper # | EMD2020-32 |
| Volume (vol) | vol.120 |
| Number (no) | no.425 |
| Page | pp.18-22 |
| #Pages | 5 |
| Date of Issue | 2021-03-01 (EMD) |
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