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| Presentation | 2021-03-05 13:35 A Study of noise source identification method based on near-field measurement of switching power supplies Hiroyasu Sano, Satoshi Suzuki, Yasuaki Kaneda, Hidekatsu Sasaki (TIRI), Kenta Umebayashi (TAT)  EMCJ2020-78 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Fast switching increases the radiated noise, which is a problem that exceeds the regulation value of radiated emission test. In particular, when multiple switching power supplies are mixed, it has been difficult to identify the source of the noise because the noise overlaps in the same frequency band. In this study, we propose a method to estimate the far-field measurement waveform of each switching power supply module by identifying the noise source based on the periodicity of the pulses in the near field. In this paper, we propose a method to estimate the far-field measurement waveform of each switching power supply. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | EMI / source identification / far field / near field / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 120, no. 420, EMCJ2020-78, pp. 30-34, March 2021. | |
| Paper # | EMCJ2020-78 | |
| Date of Issue | 2021-02-26 (EMCJ) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMCJ2020-78 |
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| Conference Information | |
| Committee | EMCJ MICT |
| Conference Date | 2021-03-05 - 2021-03-05 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | EMCJ |
| Conference Code | 2021-03-EMCJ-MICT |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Study of noise source identification method based on near-field measurement of switching power supplies |
| Sub Title (in English) | |
| Keyword(1) | EMI |
| Keyword(2) | source identification |
| Keyword(3) | far field |
| Keyword(4) | near field |
| Keyword(5) | |
| Keyword(6) | |
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| Keyword(8) | |
| 1st Author's Name | Hiroyasu Sano |
| 1st Author's Affiliation | Tokyo Metropolitan Industrial Technology Research Institute (TIRI) |
| 2nd Author's Name | Satoshi Suzuki |
| 2nd Author's Affiliation | Tokyo Metropolitan Industrial Technology Research Institute (TIRI) |
| 3rd Author's Name | Yasuaki Kaneda |
| 3rd Author's Affiliation | Tokyo Metropolitan Industrial Technology Research Institute (TIRI) |
| 4th Author's Name | Hidekatsu Sasaki |
| 4th Author's Affiliation | Tokyo Metropolitan Industrial Technology Research Institute (TIRI) |
| 5th Author's Name | Kenta Umebayashi |
| 5th Author's Affiliation | Tokyo University of Agriculture and Technology (TAT) |
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| Speaker | Author-1 |
| Date Time | 2021-03-05 13:35:00 |
| Presentation Time | 20 minutes |
| Registration for | EMCJ |
| Paper # | EMCJ2020-78 |
| Volume (vol) | vol.120 |
| Number (no) | no.420 |
| Page | pp.30-34 |
| #Pages | 5 |
| Date of Issue | 2021-02-26 (EMCJ) |
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