講演抄録/キーワード |
講演名 |
2021-02-05 11:35
A Novel High Performance Scan-Test-Aware Hardened Latch Design ○Ruijun Ma・Stefan Holst・Xiaoqing Wen(KIT)・Aibin Yan(AHU)・Hui Xu(AUST) DC2020-71 |
抄録 |
(和) |
(まだ登録されていません) |
(英) |
As modern technology nodes become more and more susceptible to soft-errors, many radiation hardened latch designs have been proposed for reliable LSI designs. Production defects in such hardened latches are difficult to detect with conventional scan testing. In our previous work, we proposed a scan-test-aware hardened latch (STAHL) design which can tolerate soft-errors and has high defect coverage. However, STAHL has higher power and delay overhead than other hardened latches in the literature. In this paper, we propose a novel high performance and scan-test-aware hardened latch (HP-STAHL). Simulation results show that HP-STAHL provides for the first time the same benefits as STAHL in terms of soft-error tolerance and testability. HP-STAHL has lower delay and power delay product (PDP) than a standard latch, which shows that HP-STAHL has high performance. |
キーワード |
(和) |
/ / / / / / / |
(英) |
soft-error / scan test / hardened latch / defect / / / / |
文献情報 |
信学技報, vol. 120, no. 358, DC2020-71, pp. 12-17, 2021年2月. |
資料番号 |
DC2020-71 |
発行日 |
2021-01-29 (DC) |
ISSN |
Online edition: ISSN 2432-6380 |
著作権に ついて |
技術研究報告に掲載された論文の著作権は電子情報通信学会に帰属します.(許諾番号:10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
PDFダウンロード |
DC2020-71 |