IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2021-01-21 14:55
Extraction Method of Time Drift Characteristics of Digital Equipment Using Incubator
Asu Kobayashi, Masumi Mitobe, Kiyonari Katsura, Naoto Hoshikawa (Oyama College), Atsushi Shiraki, Tomoyoshi Ito (Chiba Univ.) NS2020-113
Abstract (in Japanese) (See Japanese page) 
(in English) Nowadays, as the number of IoT computers increases, the risks of malicious replacement and spoofing (and so on) have been increasing and appropriate methods for digital equipment identification are needed. We propose a method for device identification using the specific correlation between time drift and CPU core temperature. However, conventional methods require a long time to measure the time drift characteristics because the CPU core temperature depends on the change of the environmental temperature. To solve this problem, we attempted to measure the characteristics using a incubator. The experimental results showed that the proposed method can measure the characteristics in the range of 3 $^circ$C to 55 $^circ$C of the CPU core temperature in a day, while the conventional method took about two months to change by about 10 $^circ$C. Furthermore, it was found that the characteristics show a cubic curve by measuring over a wide range of temperature. It was similar to the temperature characteristics of the frequency of AT-cut crystal used in clock generators, and it indicates the possibility that the time drift characteristics arise from the characteristics of the clock generator.
Keyword (in Japanese) (See Japanese page) 
(in English) IoT / system time / time drift / CPU / identification / incubator / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 327, NS2020-113, pp. 20-23, Jan. 2021.
Paper # NS2020-113 
Date of Issue 2021-01-14 (NS) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF NS2020-113

Conference Information
Committee NS NWS  
Conference Date 2021-01-21 - 2021-01-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Network software (Software architecture, Middleware), Network application, SOA/SDP, NGN/IMS/API, Distributed control/Dynamic routing, Grid, NFV, IoT, Network/System reliability, Network/System evaluation, etc. 
Paper Information
Registration To NS 
Conference Code 2021-01-NS-NWS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Extraction Method of Time Drift Characteristics of Digital Equipment Using Incubator 
Sub Title (in English)  
Keyword(1) IoT  
Keyword(2) system time  
Keyword(3) time drift  
Keyword(4) CPU  
Keyword(5) identification  
Keyword(6) incubator  
1st Author's Name Asu Kobayashi  
1st Author's Affiliation National Institute of Technology (KOSEN), Oyama College (Oyama College)
2nd Author's Name Masumi Mitobe  
2nd Author's Affiliation National Institute of Technology (KOSEN), Oyama College (Oyama College)
3rd Author's Name Kiyonari Katsura  
3rd Author's Affiliation National Institute of Technology (KOSEN), Oyama College (Oyama College)
4th Author's Name Naoto Hoshikawa  
4th Author's Affiliation National Institute of Technology (KOSEN), Oyama College (Oyama College)
5th Author's Name Atsushi Shiraki  
5th Author's Affiliation Chiba University (Chiba Univ.)
6th Author's Name Tomoyoshi Ito  
6th Author's Affiliation Chiba University (Chiba Univ.)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Date Time 2021-01-21 14:55:00 
Presentation Time 25 
Registration for NS 
Paper # IEICE-NS2020-113 
Volume (vol) IEICE-120 
Number (no) no.327 
Page pp.20-23 
#Pages IEICE-4 
Date of Issue IEICE-NS-2021-01-14 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan