Paper Abstract and Keywords |
Presentation |
2020-12-11 14:50
Long-term Software Fault Prediction with Wavelet Shrinkage Estimation Jingchi Wu Hu, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.) R2020-32 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Recently, wavelet shrinkage estimation received considerable attentions to estimate stochastic processes such as a non-homogeneous Poisson process in a non-parametric way. In this paper we focus on the long-term prediction of the number of software faults detected in the testing phase, and propose a novel long-term prediction approach based on the wavelet shrinkage estimation. The fundamental idea is to apply the denoizing available fault count data and prediction values, and to minimize a loss function with them. In numerical experiments with actual software fault count data, we investigate the predictive performance of our long-term prediction approach, and compare with the model (software reliability growth model)-based prediction approach with the maximum likelihood estimation. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Software reliability / fault prediction / non-homogeneous Poisson processes / wavelet / shrinkage estimation / predictive performance / / |
Reference Info. |
IEICE Tech. Rep., vol. 120, no. 286, R2020-32, pp. 12-17, Dec. 2020. |
Paper # |
R2020-32 |
Date of Issue |
2020-12-04 (R) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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R2020-32 |
Conference Information |
Committee |
R |
Conference Date |
2020-12-11 - 2020-12-11 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Online |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Reliability International Standard, Maintainability, Reliability General |
Paper Information |
Registration To |
R |
Conference Code |
2020-12-R |
Language |
English (Japanese title is available) |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Long-term Software Fault Prediction with Wavelet Shrinkage Estimation |
Sub Title (in English) |
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Keyword(1) |
Software reliability |
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fault prediction |
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non-homogeneous Poisson processes |
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wavelet |
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shrinkage estimation |
Keyword(6) |
predictive performance |
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1st Author's Name |
Jingchi Wu Hu |
1st Author's Affiliation |
Hiroshima University (Hiroshima Univ.) |
2nd Author's Name |
Tadashi Dohi |
2nd Author's Affiliation |
Hiroshima University (Hiroshima Univ.) |
3rd Author's Name |
Hiroyuki Okamura |
3rd Author's Affiliation |
Hiroshima University (Hiroshima Univ.) |
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Speaker |
Author-1 |
Date Time |
2020-12-11 14:50:00 |
Presentation Time |
25 minutes |
Registration for |
R |
Paper # |
R2020-32 |
Volume (vol) |
vol.120 |
Number (no) |
no.286 |
Page |
pp.12-17 |
#Pages |
6 |
Date of Issue |
2020-12-04 (R) |
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