Paper Abstract and Keywords |
Presentation |
2020-12-10 09:35
Bistatic RCS Measurement of Dual Band and Dual Polarized Reflectarray Cong Oai Nguyen, Kazuya Matsubayashi, Naobumi Michishita, Hisashi Morishita (National Defense Academy), Hiromi Matsuno, Satoshi Ito, Takahiro Hayashi, Masayuki Nakano (KDDI Research) |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In the fifth generation wireless communication systems, high frequency band such as the 28 GHz is used to high data rate. Since the mobile traffic is increasing yearly, 39 GHz band is expected to be allocated for wireless communication systems. However, radio waves have a high straight advancing property in the high frequency band, so the coverage holes where communication is not possible exist due to blockage of buildings or trees. To overcome this problem, a reflectarray has been attracted attentions to reflect the radio wave from the base station in a specified direction. In addition, since polarization MIMO is used for wireless communication systems. Therefore, a dual band and dual polarized reflectarray is required. A dual band and dual polarized reflectarray using cross dipole and square patch elements has been proposed. As a result of designing by simulation this reflectarray can achieve the 45° reflection at normal incidence for both polarization at 28 GHz and 39 GHz. In this paper, we examine the validity of the simulation results by measuring the bistatic RCS pattern of this reflectarray. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Reflectarray / Dual Band / Dual Polarized / Bistatic RCS / / / / |
Reference Info. |
IEICE Tech. Rep. |
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