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Paper Abstract and Keywords
Presentation 2020-11-30 13:25
On Software Safety Integrity Assessment for E/E/PE Safety-Related Systems
Shinji Inoue (Kansai Univ.), Takaji Fujiwara (SRATECH Lab. Inc.), Shigeru Yamada (Tottori Univ.) R2020-24
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
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(in English) / / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 267, R2020-24, pp. 7-12, Nov. 2020.
Paper # R2020-24 
Date of Issue 2020-11-23 (R) 
ISSN Online edition: ISSN 2432-6380
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee R  
Conference Date 2020-11-30 - 2020-11-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability of semiconductor and electronic devices, Reliability general 
Paper Information
Registration To R 
Conference Code 2020-11-R 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) On Software Safety Integrity Assessment for E/E/PE Safety-Related Systems 
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1st Author's Name Shinji Inoue  
1st Author's Affiliation Kansai University (Kansai Univ.)
2nd Author's Name Takaji Fujiwara  
2nd Author's Affiliation SRATECH Laboratory Inc. (SRATECH Lab. Inc.)
3rd Author's Name Shigeru Yamada  
3rd Author's Affiliation Tottori University (Tottori Univ.)
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Date Time 2020-11-30 13:25:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2020-24 
Volume (vol) vol.120 
Number (no) no.267 
Page pp.7-12 
#Pages
Date of Issue 2020-11-23 (R) 


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