| IEICE Technical Committee Submission System Conference Paper's Information |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| Paper Abstract and Keywords | ||
| Presentation | 2020-11-20 10:30 [Invited Talk] Power Device Degradation Estimation by Machine Learning of Gate Waveforms Hiromu Yamasaki, Koutaro Miyazaki, Yang Lo, A. K. M. Mahfuzul Islam, Katsuhiro Hata, Takayasu Sakurai, Makoto Takamiya (Univ. of Tokyo)  SDM2020-29 Link to ES Tech. Rep. Archives: SDM2020-29 |
|
| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | A method to detect bonding wire lift-off of SiC MOSFETs using machine learning from the gate voltage waveform is proposed. In this paper, we proposed a new method that can be applied to 3-terminal SiC MOSFETs without the need for insulation compared to the conventional bonding wire lift-off detection method and demonstrated its effectiveness by SPICE simulation. By applying a linear regression algorithm to the two parameters extracted from the gate voltage waveform, we succeeded in constructing a bonding wire lift-off detection method that is robust to load current and temperature fluctuations. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Linear regression / Machine learning / Power device / Reliability / Gate / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 120, no. 239, SDM2020-29, pp. 32-35, Nov. 2020. | |
| Paper # | SDM2020-29 | |
| Date of Issue | 2020-11-12 (SDM) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SDM2020-29 Link to ES Tech. Rep. Archives: SDM2020-29 |
|
| Conference Information | |
| Committee | SDM |
| Conference Date | 2020-11-19 - 2020-11-20 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Process, Device, Circuit simulation, etc. |
| Paper Information | |
| Registration To | SDM |
| Conference Code | 2020-11-SDM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Power Device Degradation Estimation by Machine Learning of Gate Waveforms |
| Sub Title (in English) | |
| Keyword(1) | Linear regression |
| Keyword(2) | Machine learning |
| Keyword(3) | Power device |
| Keyword(4) | Reliability |
| Keyword(5) | Gate |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Hiromu Yamasaki |
| 1st Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 2nd Author's Name | Koutaro Miyazaki |
| 2nd Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 3rd Author's Name | Yang Lo |
| 3rd Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 4th Author's Name | A. K. M. Mahfuzul Islam |
| 4th Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 5th Author's Name | Katsuhiro Hata |
| 5th Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 6th Author's Name | Takayasu Sakurai |
| 6th Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 7th Author's Name | Makoto Takamiya |
| 7th Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 8th Author's Name | |
| 8th Author's Affiliation | () |
| 9th Author's Name | |
| 9th Author's Affiliation | () |
| 10th Author's Name | |
| 10th Author's Affiliation | () |
| 11th Author's Name | |
| 11th Author's Affiliation | () |
| 12th Author's Name | |
| 12th Author's Affiliation | () |
| 13th Author's Name | |
| 13th Author's Affiliation | () |
| 14th Author's Name | |
| 14th Author's Affiliation | () |
| 15th Author's Name | |
| 15th Author's Affiliation | () |
| 16th Author's Name | |
| 16th Author's Affiliation | () |
| 17th Author's Name | |
| 17th Author's Affiliation | () |
| 18th Author's Name | |
| 18th Author's Affiliation | () |
| Speaker | Author-7 |
| Date Time | 2020-11-20 10:30:00 |
| Presentation Time | 60 minutes |
| Registration for | SDM |
| Paper # | SDM2020-29 |
| Volume (vol) | vol.120 |
| Number (no) | no.239 |
| Page | pp.32-35 |
| #Pages | 4 |
| Date of Issue | 2020-11-12 (SDM) |
[Return to Top Page]