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Paper Abstract and Keywords
Presentation 2020-11-17 11:20
Control Point Selection Approach for Scan Pattern Reduction under Multi-cycle Test
Hikaru Tamaki, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
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Reference Info. IEICE Tech. Rep., vol. 120, no. 236, DC2020-35, pp. 24-29, Nov. 2020.
Paper # DC2020-35 
Date of Issue 2020-11-10 (VLD, ICD, DC, RECONF) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34

Conference Information
Conference Date 2020-11-17 - 2020-11-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2020 -New Field of VLSI Design- 
Paper Information
Registration To DC 
Conference Code 2020-11-VLD-DC-RECONF-ICD-SLDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Control Point Selection Approach for Scan Pattern Reduction under Multi-cycle Test 
Sub Title (in English)  
1st Author's Name Hikaru Tamaki  
1st Author's Affiliation Ehime University (Ehime Univ.)
2nd Author's Name Senling Wang  
2nd Author's Affiliation Ehime University (Ehime Univ.)
3rd Author's Name Yoshinobu Higami  
3rd Author's Affiliation Ehime University (Ehime Univ.)
4th Author's Name Hiroshi Takahashi  
4th Author's Affiliation Ehime University (Ehime Univ.)
5th Author's Name Hiroyuki Iwata  
5th Author's Affiliation Renesas Electronics Corporation (Renesas)
6th Author's Name Yoichi Maeda  
6th Author's Affiliation Renesas Electronics Corporation (Renesas)
7th Author's Name Jun Matsushima  
7th Author's Affiliation Renesas Electronics Corporation (Renesas)
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Date Time 2020-11-17 11:20:00 
Presentation Time 25 
Registration for DC 
Paper # IEICE-VLD2020-15,IEICE-ICD2020-35,IEICE-DC2020-35,IEICE-RECONF2020-34 
Volume (vol) IEICE-120 
Number (no) no.234(VLD), no.235(ICD), no.236(DC), no.237(RECONF) 
Page pp.24-29 
#Pages IEICE-6 
Date of Issue IEICE-VLD-2020-11-10,IEICE-ICD-2020-11-10,IEICE-DC-2020-11-10,IEICE-RECONF-2020-11-10 

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