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Paper Abstract and Keywords
Presentation 2020-11-13 15:45
High precision shape measurement using hiigh coherence wavelength swept light soruce
Takanori Saitoh (Anritsu) OFT2020-43
Abstract (in Japanese) (See Japanese page) 
(in English) We developed a 3D shape measurement system with OFDR using a high coherence wavelength swept light source. The 3D shape measurement system can measure absolute distance whose range of from 0m to 3m with 0.2 μm precision, and can measure 3D shape by scanning direction of the collimator lens .
Keyword (in Japanese) (See Japanese page) 
(in English) OFDR / FMCW / 3D Shape / Swept light source / Coherence / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 230, OFT2020-43, pp. 33-38, Nov. 2020.
Paper # OFT2020-43 
Date of Issue 2020-11-05 (OFT) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee OFT ITE-BCT OCS IEE-CMN  
Conference Date 2020-11-12 - 2020-11-13 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To OFT 
Conference Code 2020-11-OFT-BCT-OCS-CMN 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) High precision shape measurement using hiigh coherence wavelength swept light soruce 
Sub Title (in English)  
Keyword(1) OFDR  
Keyword(2) FMCW  
Keyword(3) 3D Shape  
Keyword(4) Swept light source  
Keyword(5) Coherence  
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1st Author's Name Takanori Saitoh  
1st Author's Affiliation Anritsu (Anritsu)
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Speaker
Date Time 2020-11-13 15:45:00 
Presentation Time 25 
Registration for OFT 
Paper # IEICE-OFT2020-43 
Volume (vol) IEICE-120 
Number (no) no.230 
Page pp.33-38 
#Pages IEICE-6 
Date of Issue IEICE-OFT-2020-11-05 


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