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| Presentation | 2020-10-26 09:50 Fundamental Evaluation Method of EM Information Leakage Caused by Intentional Electromagnetic Interference -- Impact of Impedance Change in Digital Output Circuits -- Shugo Kaji, Daisuke Fujimoto (NAIST), Masahiro Kinugawa (Univ. of Fukuchiyama), Yuichi Hayashi (NAIST)  HWS2020-27 ICD2020-16 Link to ES Tech. Rep. Archives: ICD2020-16 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | New threats have been shown to cause information leakage by irradiating electromagnetic (EM) waves of specific intensity and frequency to devices. To clarify this threat's target, we develop a simplified evaluation system for the output circuits of digital ICs as a leakage source and evaluate the sensitivity of the output circuit against EM waves to induce EM leakage in the frequency domain. The result of the experiment shows that EM leakage was confirmed in the range of 500 MHz to 1.2 GHz; we have shown that the attack works with specific frequency bands. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Electromagnetic Information Leakage / TEMPEST / Intentional Electromagnetic Interference / IEMI / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 120, no. 211, HWS2020-27, pp. 13-17, Oct. 2020. | |
| Paper # | HWS2020-27 | |
| Date of Issue | 2020-10-19 (HWS, ICD) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | HWS2020-27 ICD2020-16 Link to ES Tech. Rep. Archives: ICD2020-16 |
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| Conference Information | |
| Committee | ICD HWS |
| Conference Date | 2020-10-26 - 2020-10-26 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Hardware Security, etc. |
| Paper Information | |
| Registration To | HWS |
| Conference Code | 2020-10-ICD-HWS |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Fundamental Evaluation Method of EM Information Leakage Caused by Intentional Electromagnetic Interference |
| Sub Title (in English) | Impact of Impedance Change in Digital Output Circuits |
| Keyword(1) | Electromagnetic Information Leakage |
| Keyword(2) | TEMPEST |
| Keyword(3) | Intentional Electromagnetic Interference |
| Keyword(4) | IEMI |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Shugo Kaji |
| 1st Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 2nd Author's Name | Daisuke Fujimoto |
| 2nd Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 3rd Author's Name | Masahiro Kinugawa |
| 3rd Author's Affiliation | The University of Fukuchiyama (Univ. of Fukuchiyama) |
| 4th Author's Name | Yuichi Hayashi |
| 4th Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
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| Speaker | Author-1 |
| Date Time | 2020-10-26 09:50:00 |
| Presentation Time | 25 minutes |
| Registration for | HWS |
| Paper # | HWS2020-27, ICD2020-16 |
| Volume (vol) | vol.120 |
| Number (no) | no.211(HWS), no.212(ICD) |
| Page | pp.13-17 |
| #Pages | 5 |
| Date of Issue | 2020-10-19 (HWS, ICD) |
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