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Paper Abstract and Keywords
Presentation 2020-10-26 09:50
Fundamental Evaluation Method of EM Information Leakage Caused by Intentional Electromagnetic Interference -- Impact of Impedance Change in Digital Output Circuits --
Shugo Kaji, Daisuke Fujimoto (NAIST), Masahiro Kinugawa (Univ. of Fukuchiyama), Yuichi Hayashi (NAIST) HWS2020-27 ICD2020-16
Abstract (in Japanese) (See Japanese page) 
(in English) New threats have been shown to cause information leakage by irradiating electromagnetic (EM) waves of specific intensity and frequency to devices. To clarify this threat's target, we develop a simplified evaluation system for the output circuits of digital ICs as a leakage source and evaluate the sensitivity of the output circuit against EM waves to induce EM leakage in the frequency domain. The result of the experiment shows that EM leakage was confirmed in the range of 500 MHz to 1.2 GHz; we have shown that the attack works with specific frequency bands.
Keyword (in Japanese) (See Japanese page) 
(in English) Electromagnetic Information Leakage / TEMPEST / Intentional Electromagnetic Interference / IEMI / / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 211, HWS2020-27, pp. 13-17, Oct. 2020.
Paper # HWS2020-27 
Date of Issue 2020-10-19 (HWS, ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF HWS2020-27 ICD2020-16

Conference Information
Committee ICD HWS  
Conference Date 2020-10-26 - 2020-10-26 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Hardware Security, etc. 
Paper Information
Registration To HWS 
Conference Code 2020-10-ICD-HWS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fundamental Evaluation Method of EM Information Leakage Caused by Intentional Electromagnetic Interference 
Sub Title (in English) Impact of Impedance Change in Digital Output Circuits 
Keyword(1) Electromagnetic Information Leakage  
Keyword(2) TEMPEST  
Keyword(3) Intentional Electromagnetic Interference  
Keyword(4) IEMI  
1st Author's Name Shugo Kaji  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Daisuke Fujimoto  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Masahiro Kinugawa  
3rd Author's Affiliation The University of Fukuchiyama (Univ. of Fukuchiyama)
4th Author's Name Yuichi Hayashi  
4th Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Date Time 2020-10-26 09:50:00 
Presentation Time 25 
Registration for HWS 
Paper # IEICE-HWS2020-27,IEICE-ICD2020-16 
Volume (vol) IEICE-120 
Number (no) no.211(HWS), no.212(ICD) 
Page pp.13-17 
#Pages IEICE-5 
Date of Issue IEICE-HWS-2020-10-19,IEICE-ICD-2020-10-19 

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