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Paper Abstract and Keywords
Presentation 2020-10-26 09:00
Examination of requirements for power side-channel attack resistance evaluation boards of cryptographic integrated circuits -- PDN transfer impedance contributing to leakage strength --
Tomonobu Kan, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) HWS2020-25 ICD2020-14
Abstract (in Japanese) (See Japanese page) 
(in English) When evaluating the resistance of a cryptographic circuit to power analysis attacks by measurement, it is not easy to evaluate the IC alone, so the evaluation is performed by mounting the IC on the evaluation board. However, the evaluation board’s specifications are not defined, and even if the same IC is evaluated, the evaluation result may differ depending on the mounted evaluation board. Since it is not possible to determine which evaluation result is credible, it is necessary to unify the evaluation environment. In this study, we consider that side-channel information leakage depends on the transfer impedance, and the purpose is to determine the required specifications of the transfer impedance. In this paper, we show an example in which the evaluation results of side-channel attack resistance differ between the inside of the IC and the substrate, and confirm that the side-channel information leakage depends on the transmission impedance. Using two types of evaluation boards, SASEBO-G and SENPU, the correlation coefficient calculated from the SC leakage waveform measured at the measurement port on the evaluation board was about the same. SENPU, in contrast, had a larger correlation coefficient at the IC level that was calculated from the relational expression between SNR and the correlation coefficient. Comparing the amplitudes of the leaked waveforms, SASEBO-G was 18 times larger. We also calculated the transfer impedance based on the equivalent circuits of the power distribution networks of the FPGA core circuits of both boards. SASEBO-G was larger transfer impedances than SENPU. This result shows that the side-channel information leakage depends on the transfer impedance of the IC power distribution network.
Keyword (in Japanese) (See Japanese page) 
(in English) Side-channel attack / Correlation power analysis / AES / Evaluation board / Signal to noise ratio (SNR) / Transfer impedance / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 211, HWS2020-25, pp. 1-6, Oct. 2020.
Paper # HWS2020-25 
Date of Issue 2020-10-19 (HWS, ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF HWS2020-25 ICD2020-14

Conference Information
Committee ICD HWS  
Conference Date 2020-10-26 - 2020-10-26 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Hardware Security, etc. 
Paper Information
Registration To HWS 
Conference Code 2020-10-ICD-HWS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Examination of requirements for power side-channel attack resistance evaluation boards of cryptographic integrated circuits 
Sub Title (in English) PDN transfer impedance contributing to leakage strength 
Keyword(1) Side-channel attack  
Keyword(2) Correlation power analysis  
Keyword(3) AES  
Keyword(4) Evaluation board  
Keyword(5) Signal to noise ratio (SNR)  
Keyword(6) Transfer impedance  
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Keyword(8)  
1st Author's Name Tomonobu Kan  
1st Author's Affiliation Okayama University (Okayama Univ.)
2nd Author's Name Kengo Iokibe  
2nd Author's Affiliation Okayama University (Okayama Univ.)
3rd Author's Name Yoshitaka Toyota  
3rd Author's Affiliation Okayama University (Okayama Univ.)
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Speaker
Date Time 2020-10-26 09:00:00 
Presentation Time 25 
Registration for HWS 
Paper # IEICE-HWS2020-25,IEICE-ICD2020-14 
Volume (vol) IEICE-120 
Number (no) no.211(HWS), no.212(ICD) 
Page pp.1-6 
#Pages IEICE-6 
Date of Issue IEICE-HWS-2020-10-19,IEICE-ICD-2020-10-19 


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