Paper Abstract and Keywords |
Presentation |
2020-09-28 13:50
Fast Scanning Method for Measuring Material Homogeneity using the Line-Focus-Beam Ultrasonic-Material-Characterization System Yuji Ohashi, Yuui Yokota, Akihiro Yamaji, Masao Yoshino, Shunnsuke Kurosawa, Kei Kamada, Hiroki Sato, Satoshi Toyoda, Takashi Hanada, Akira Yoshikawa (Tohoku Univ.) US2020-34 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We proposed and demonstrated a new method for measuring material homogeneity using fast scanning technique with the line-focus-beam ultrasonic-material-characterization (LFB-UMC) system. We could successfully obtain similar velocity profile of leaky surface acoustic wave (LSAW) for a Ca3Ta(Ga0.75Al0.25)3Si2O14[CTGAS] single crystal specimen by both of the new V(x) and the conventional V(z) methods. We have verified the new V(x) method was 56 times faster than the conventional V(z) method. Although the V(z) method is superior to the V(x) method in a viewpoint of measurement accuracy, the V(x) method has great advantage that it is possible to quickly evaluate material homogeneity over the wide area of specimen. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Line-focus-beam ultrasonic material characterization (LFB-UMC) system / Leaky surface acoustic wave (LSAW) velocity / V(z) curve analysis / Measuring material homogeneity / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 120, no. 174, US2020-34, pp. 41-44, Sept. 2020. |
Paper # |
US2020-34 |
Date of Issue |
2020-09-21 (US) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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US2020-34 |