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| Presentation | 2020-09-02 13:35 Experimental Evaluation of Relationship between Gate-to-Gate Interconnection and Bit Error Rate of Adiabatic Quantum Flux Parametron Circuits Daiki Ito (Yokohama Natl. Univ.), Naoki Takeuchi (IAS), Yuki Yamanashi, Nobuyuki Yoshikawa (Yokohama Natl. Univ.)  SCE2020-2 Link to ES Tech. Rep. Archives: SCE2020-2 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Superconducting circuits are expected to significantly reduce the power consumption when applied to the next-generation computer systems. The adiabatic quantum flux parametron (AQFP) circuit, which is one of the superconducting circuits, is excellent in terms of low power consumption among superconducting circuits. Since the AQFP circuit operates with very small currents, it is necessary to design the AQFP circuit in consideration of gate-to-gate interconnection length. In this study, the relationship between bit error rate (BER) and gate-to-gate currents of the AQFP circuit was evaluated by circuit simulations taking account of the thermal noise. It was found that the minimum value of gate-to-gate currents so that the AQFP buffer operates with the BER less than 10^-23 was 7.5 μA at an operating frequency of 5 GHz. It corresponds to the gate-to-gate interconnection length of 0.696 mm. We also measured BERs of the AQFP buffer. The BERs obtained in the experiment were about 10^-7 at the 0.7 GHz operation frequency, which was higher than those in the simulation. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | quantum flux parametron / BER / adiabatic circuits / AQFP / superconducting integrated circuits / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 120, no. 153, SCE2020-2, pp. 5-10, Sept. 2020. | |
| Paper # | SCE2020-2 | |
| Date of Issue | 2020-08-26 (SCE) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SCE2020-2 Link to ES Tech. Rep. Archives: SCE2020-2 |
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| Conference Information | |
| Committee | SCE |
| Conference Date | 2020-09-02 - 2020-09-02 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | SQUID, Detector, etc. |
| Paper Information | |
| Registration To | SCE |
| Conference Code | 2020-09-SCE |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Experimental Evaluation of Relationship between Gate-to-Gate Interconnection and Bit Error Rate of Adiabatic Quantum Flux Parametron Circuits |
| Sub Title (in English) | |
| Keyword(1) | quantum flux parametron |
| Keyword(2) | BER |
| Keyword(3) | adiabatic circuits |
| Keyword(4) | AQFP |
| Keyword(5) | superconducting integrated circuits |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Daiki Ito |
| 1st Author's Affiliation | Yokohama National University (Yokohama Natl. Univ.) |
| 2nd Author's Name | Naoki Takeuchi |
| 2nd Author's Affiliation | Yokohama National University Institute of Advanced Sciences (IAS) |
| 3rd Author's Name | Yuki Yamanashi |
| 3rd Author's Affiliation | Yokohama National University (Yokohama Natl. Univ.) |
| 4th Author's Name | Nobuyuki Yoshikawa |
| 4th Author's Affiliation | Yokohama National University (Yokohama Natl. Univ.) |
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| Speaker | Author-1 |
| Date Time | 2020-09-02 13:35:00 |
| Presentation Time | 25 minutes |
| Registration for | SCE |
| Paper # | SCE2020-2 |
| Volume (vol) | vol.120 |
| Number (no) | no.153 |
| Page | pp.5-10 |
| #Pages | 6 |
| Date of Issue | 2020-08-26 (SCE) |
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